Inventor · disambiguated record
Rainer Giedigkeit
Also filed as: GIEDIGKEIT RAINER
4 granted patents·3 pending applications·28 citations·filing 2007–2012
72Inventor score
Files withBEYER SVEN1FITZ CLEMENS1FOERDERUNG DER WISSENSCHAFTEN E V MAX PLANCK GES ZUR1GIEDIGKEIT RAINER1GLOBALFOUNDRIES INC1
Top patents by PatentIndex Score
7 records- 0189US8791509B2Multiple gate transistor having homogenously silicided fin end portionsBEYER SVEN·Filed 2009·Granted Jul 29, 2014·20 cites·20 claims
- 0272US8338654B2Hydrogenation process using catalyst comprising ordered intermetallic compoundGIEDIGKEIT RAINER·Filed 2007·Granted Dec 25, 2012·5 cites·12 claims
- 0365US8673668B2Test structure for controlling the incorporation of semiconductor alloys in transistors comprising high-k metal gate electrode structuresKRONHOLZ STEPHAN·Filed 2010·Granted Mar 18, 2014·2 cites·17 claims
- 0455US8501545B2Reduction of mechanical stress in metal stacks of sophisticated semiconductor devices during die-substrate soldering by an enhanced cool down regimeGRILLBERGER MICHAEL·Filed 2010·Granted Aug 6, 2013·1 cites·21 claims
- 0546US2013184507A1Hydrogenation Process Using Catalyst Comprising Ordered Intermetallic CompoundFOERDERUNG DER WISSENSCHAFTEN E V MAX PLANCK GES ZUR·Filed 2012·Application pending·0 cites
- 0633US2011266638A1Semiconductor Device Comprising Contact Elements and Metal Silicide Regions Formed in a Common Process SequenceGLOBALFOUNDRIES INC·Filed 2010·Application pending·0 cites
- 0729US2013049124A1Mosfet integrated circuit with improved silicide thickness uniformity and methods for its manufactureFITZ CLEMENS·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →