Inventor · disambiguated record
Richard David Jacobs
Also filed as: JACOBS RICHARD · JACOBS RICHARD DAVID
4 granted patents·4 pending applications·9 citations·filing 2009–2023
64Inventor score
Files withASML NETHERLANDS BV3CATEY ERIC BRIAN1DEN OEF ARIE JEFFREY1SHMAREV YEVGENIY KONSTANTINOVICH1SMIRNOV STANISLAV Y1
Top patents by PatentIndex Score
8 records- 0176US2024103386A1Apparatus and method for determining a condition associated with a pellicleASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0275US8189203B2Reticle inspection systems and methodSHMAREV YEVGENIY KONSTANTINOVICH·Filed 2009·Granted May 29, 2012·7 cites·20 claims
- 0373US9285687B2Inspection apparatus, lithographic apparatus, and device manufacturing methodSMIRNOV STANISLAV Y·Filed 2012·Granted Mar 15, 2016·2 cites·21 claims
- 0460US11906907B2Apparatus and method for determining a condition associated with a pellicleASML NETHERLANDS BV·Filed 2018·Granted Feb 20, 2024·0 cites·20 claims
- 0559US2025068090A1Mechanically controlled stress-engineered optical systems and methodsASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0639US2012081684A1Object Inspection Systems and MethodsDEN OEF ARIE JEFFREY·Filed 2010·Application pending·0 cites
- 0737US2012281197A1Holographic Mask Inspection System with Spatial FilterTHARALDSEN ROBERT ALBERT·Filed 2010·Application pending·0 cites
- 0834US8623576B2Time differential reticle inspectionCATEY ERIC BRIAN·Filed 2010·Granted Jan 7, 2014·0 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Richard David Jacobs files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →