Inventor · disambiguated record
Richard Jenkins
Also filed as: JENKINS RICHARD J · JENKINS RICHARD JON
6 granted patents·2 pending applications·113 citations·filing 1985–2005
85Inventor score
Files withAIR PROD & CHEM2ARCH SPEC CHEM INC2PLANAR SOLUTIONS LLC2BRUSIC VLASTA1LUCENT TECHNOLOGIES INC1
Top patents by PatentIndex Score
8 records- 0188US4603040AMassive bodies of Maximum Aluminum X-type zeoliteAIR PROD & CHEM·Filed 1985·Granted Jul 29, 1986·48 cites·6 claims
- 0282US8062096B2Use of CMP for aluminum mirror and solar cell fabricationBRUSIC VLASTA·Filed 2005·Granted Nov 22, 2011·10 cites·42 claims
- 0378US6749488B2Chemical mechanical polishing slurry composition for polishing conductive and non-conductive layers on semiconductor wafersPLANAR SOLUTIONS LLC·Filed 2002·Granted Jun 15, 2004·24 cites·2 claims
- 0467US6776696B2Continuous chemical mechanical polishing process for polishing multiple conductive and non-conductive layers on semiconductor wafersPLANAR SOLUTIONS LLC·Filed 2002·Granted Aug 17, 2004·12 cites·72 claims
- 0551US5026914AHydrogenation of aromatic amines using rhodium on titania or zirconia supportAIR PROD & CHEM·Filed 1989·Granted Jun 25, 1991·11 cites·27 claims
- 0636US2003104770A1Chemical mechanical polishing slurry composition for polishing conductive and non-conductive layers on semiconductor wafersARCH SPEC CHEM INC·Filed 2001·Application pending·0 cites
- 0735US2004159050A1Chemical mechanical polishing slurry composition for polishing conductive and non-conductive layers on semiconductor wafersARCH SPEC CHEM INC·Filed 2003·Application pending·0 cites
- 0832US6230293B1Method for quality and reliability assurance testing of integrated circuits using differential Iddq screening in lieu of burn-inLUCENT TECHNOLOGIES INC·Filed 1998·Granted May 8, 2001·8 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →