Inventor · disambiguated record
Ricardo P. Mikalo
Also filed as: MIKALO RICARDO · MIKALO RICARDO P · MIKALO RICARDO PABLO
20 granted patents·7 pending applications·38 citations·filing 2004–2017
91Inventor score
Files withGLOBALFOUNDRIES INC9FLACHOWSKY STEFAN5INFINEON TECHNOLOGIES AG4MIKALO RICARDO P4GLOBAL FOUNDRIES US INC1
Top patents by PatentIndex Score
27 records- 0184US9257353B1Integrated circuits with test structures including bi-directional protection diodesGLOBALFOUNDRIES INC·Filed 2014·Granted Feb 9, 2016·8 cites·20 claims
- 0284US8524566B2Methods for the fabrication of integrated circuits including back-etching of raised conductive structuresFLACHOWSKY STEFAN·Filed 2011·Granted Sep 3, 2013·7 cites·20 claims
- 0378US10048311B2Detection of gate-to-source/drain shortsGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 14, 2018·2 cites·16 claims
- 0471US7411837B2Method for operating an electrical writable and erasable memory cell and a memory device for electrical memoriesINFINEON TECHNOLOGIES AG·Filed 2006·Granted Aug 12, 2008·4 cites·43 claims
- 0569US9093554B2Methods of forming semiconductor devices with embedded semiconductor material as source/drain regions using a reduced number of spacersFLACHOWSKY STEFAN·Filed 2012·Granted Jul 28, 2015·2 cites·21 claims
- 0668US9087587B2Integrated circuits and methods for operating integrated circuits with non-volatile memoryGLOBALFOUNDRIES INC·Filed 2013·Granted Jul 21, 2015·3 cites·18 claims
- 0766US9368506B2Integrated circuits and methods for operating integrated circuits with non-volatile memoryGLOBALFOUNDRIES INC·Filed 2015·Granted Jun 14, 2016·2 cites·19 claims
- 0866US8669170B2Methods of reducing gate leakageMIKALO RICARDO P·Filed 2012·Granted Mar 11, 2014·2 cites·23 claims
- 0964US9508618B2Staggered electrical frame structures for frame area reductionGLOBAL FOUNDRIES US INC·Filed 2014·Granted Nov 29, 2016·2 cites·18 claims
- 1063US10147659B1Method and structure for process limiting yield testingGLOBALFOUNDRIES INC·Filed 2017·Granted Dec 4, 2018·1 cites·19 claims
- 1159US7733698B2Memory device, a non-volatile semiconductor memory device and a method of forming a memory deviceQIMONDA AG·Filed 2007·Granted Jun 8, 2010·2 cites·20 claims
- 1251US7145807B2Method for operating an electrical writable and erasable memory cell and a memory device for electrical memoriesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 5, 2006·2 cites·11 claims
- 1350US9696376B2Leakage testing of integrated circuits using a logarithmic transducer and a voltmeterGLOBALFOUNDRIES INC·Filed 2015·Granted Jul 4, 2017·0 cites·18 claims
- 1450US9324654B2Integrated circuits with electronic fuse structuresGLOBALFOUNDRIES INC·Filed 2014·Granted Apr 26, 2016·0 cites·16 claims
- 1546US10256134B2Heat dissipative element for polysilicon resistor bankGLOBALFOUNDRIES INC·Filed 2017·Granted Apr 9, 2019·0 cites·18 claims
- 1644US2016204065A1Integrated circuits with electronic fuse structuresGLOBALFOUNDRIES INC·Filed 2016·Application pending·0 cites
- 1742US8476131B2Methods of forming a semiconductor device with recessed source/design regions, and a semiconductor device comprising sameFLACHOWSKY STEFAN·Filed 2011·Granted Jul 2, 2013·0 cites·15 claims
- 1840US7015095B2Method for fabricating a semiconductor memory having charge trapping memory cells and semiconductor substrateINFINEON TECHNOLOGIES AG·Filed 2004·Granted Mar 21, 2006·1 cites·16 claims
- 1938US8642420B2Fabrication of a semiconductor device with extended epitaxial semiconductor regionsFLACHOWSKY STEFAN·Filed 2011·Granted Feb 4, 2014·0 cites·19 claims
- 2038US2013065367A1Methods of Forming Highly Scaled Semiconductor Devices Using a Reduced Number of SpacersFLACHOWSKY STEFAN·Filed 2011·Application pending·0 cites
- 2136US8536019B2Semiconductor devices having encapsulated isolation regions and related fabrication methodsMIKALO RICARDO P·Filed 2011·Granted Sep 17, 2013·0 cites·13 claims
- 2236US7144776B1Charge-trapping memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 5, 2006·0 cites·10 claims
- 2336US2013207275A1Methods of Forming Device Level Conductive Contacts to Improve Device Performance and Semiconductor Devices Comprising Such ContactsMIKALO RICARDO P·Filed 2012·Application pending·0 cites
- 2436US2008099828A1Semiconductor structure, semiconductor memory device and method of manufacturing the sameHEINRICHSDORFF FRANK·Filed 2006·Application pending·0 cites
- 2535US2007238240A1Method of forming a transistor in a non-volatile memory deviceOLLIGS DOMINIK·Filed 2006·Application pending·0 cites
- 2633US2005275059A1Isolation trench arrangementMIKALO RICARDO P·Filed 2005·Application pending·0 cites
- 2730US2006054964A1Semiconductor device and method for fabricating a region thereonISLER MARK·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →