Inventor · disambiguated record
Roy J. Henson
Also filed as: HENSON ROY · HENSON ROY J · HENSON ROY JOHN
13 granted patents·4 pending applications·573 citations·filing 1996–2023
94Inventor score
Top patents by PatentIndex Score
17 records- 0196US6839964B2Method for manufacturing a multi-layer printed circuit boardFORMFACTOR INC·Filed 2002·Granted Jan 11, 2005·129 cites·12 claims
- 0295US6911835B2High performance probe systemFORMFACTOR INC·Filed 2003·Granted Jun 28, 2005·127 cites·18 claims
- 0394US7245134B2Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probesFORMFACTOR INC·Filed 2005·Granted Jul 17, 2007·64 cites·14 claims
- 0493US7307433B2Intelligent probe card architectureFORMFACTOR INC·Filed 2004·Granted Dec 11, 2007·66 cites·5 claims
- 0593US6720501B1PC board having clustered blind viasFORMFACTOR INC·Filed 1998·Granted Apr 13, 2004·90 cites·16 claims
- 0687US8581610B2Method of designing an application specific probe card test systemMILLER CHARLES A·Filed 2006·Granted Nov 12, 2013·14 cites·12 claims
- 0787US7852094B2Sharing resources in a system for testing semiconductor devicesFORMFACTOR INC·Filed 2006·Granted Dec 14, 2010·13 cites·18 claims
- 0884US7649366B2Method and apparatus for switching tester resourcesFORMFACTOR INC·Filed 2006·Granted Jan 19, 2010·13 cites·22 claims
- 0984US7282933B2Probe head arraysFORMFACTOR INC·Filed 2005·Granted Oct 16, 2007·10 cites·20 claims
- 1078US7692433B2Sawing tile corners on probe card substratesFORMFACTOR INC·Filed 2006·Granted Apr 6, 2010·7 cites·13 claims
- 1169US5867033ACircuit for testing the operation of a semiconductor deviceLSI LOGIC CORP·Filed 1996·Granted Feb 2, 1999·31 cites·29 claims
- 1263US8154315B2Self-referencing voltage regulatorHENSON ROY JOHN·Filed 2008·Granted Apr 10, 2012·9 cites·20 claims
- 1352US2008100320A1Intelligent probe card architectureFORMFACTOR INC·Filed 2007·Application pending·0 cites
- 1451US11626357B23D electrical integration using component carrier edge connections to a 2D contact arrayFORMFACTOR INC·Filed 2021·Granted Apr 11, 2023·0 cites·7 claims
- 1550US2023269118A1Single wire serial communication using pulse width modulation in a daisy chain architectureFORMFACTOR INC·Filed 2023·Application pending·0 cites
- 1649US2007261009A1Programmable devices to route signals on probe cardsFORMFACTOR INC·Filed 2007·Application pending·0 cites
- 1739US2006214679A1Active diagnostic interface for wafer probe applicationsFORMFACTOR INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →