Inventor · disambiguated record
Ruben Alvarez Sanchez
Also filed as: ALVAREZ SANCHEZ RUBEN
5 granted patents·15 citations·filing 2009–2021
71Inventor score
Files withASML NETHERLANDS BV2ABEN MARIA JOHANNA HENDRIKA1BOTTIGLIERI GERARDO1LEEWIS CHRISTIAN MARINUS1
Top patents by PatentIndex Score
5 records- 0178US9977340B2Method and apparatus for measuring a structure on a substrate, computer program products for implementing such methods and apparatusABEN MARIA JOHANNA HENDRIKA·Filed 2011·Granted May 22, 2018·9 cites·17 claims
- 0274US11086229B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Aug 10, 2021·1 cites·24 claims
- 0372US9360768B2Inspection method and apparatusBOTTIGLIERI GERARDO·Filed 2012·Granted Jun 7, 2016·5 cites·17 claims
- 0470US11714357B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 0551US8848195B2Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method for determining a property of a substrateLEEWIS CHRISTIAN MARINUS·Filed 2009·Granted Sep 30, 2014·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →