Inventor · disambiguated record
Rui-Fang Shi
Also filed as: SHI RUI · SHI RUI-FANG
47 granted patents·26 pending applications·204 citations·filing 1996–2025
97Inventor score
Files withKLA TENCOR CORP23KLA CORP13DOW GLOBAL TECHNOLOGIES LLC10BEIJING VOLCANO ENGINE TECHNOLOGY CO LTD7BYTEDANCE TECH LTD3
Top patents by PatentIndex Score
73 records- 0194US11544964B2Vision based target tracking that distinguishes facial feature targetsDEEPNORTH INC·Filed 2020·Granted Jan 3, 2023·3 cites·20 claims
- 0294US7995832B2Photomask inspection and verification by lithography image reconstruction using imaging pupil filtersKLA TENCOR CORP·Filed 2007·Granted Aug 9, 2011·36 cites·18 claims
- 0393US9547892B2Apparatus and methods for predicting wafer-level defect printabilityKLA TENCOR CORP·Filed 2015·Granted Jan 17, 2017·7 cites·29 claims
- 0492US10634623B2Phase contrast monitoring for extreme ultra-violet (EUV) masks defect inspectionKLA TENCOR CORP·Filed 2017·Granted Apr 28, 2020·5 cites·24 claims
- 0592US9478019B2Reticle inspection using near-field recoveryKLA TENCOR CORP·Filed 2015·Granted Oct 25, 2016·7 cites·41 claims
- 0692US7962863B2Computer-implemented methods, systems, and computer-readable media for determining a model for predicting printability of reticle features on a waferKLA TENCOR CORP·Filed 2008·Granted Jun 14, 2011·19 cites·19 claims
- 0790US12133318B2Rotating target for extreme ultraviolet source with liquid metalKLA CORP·Filed 2022·Granted Oct 29, 2024·1 cites·21 claims
- 0887US10902243B2Vision based target tracking that distinguishes facial feature targetsVMAXX INC·Filed 2017·Granted Jan 26, 2021·6 cites·21 claims
- 0987US10168273B1Methods and apparatus for polarizing reticle inspectionKLA TENCOR CORP·Filed 2017·Granted Jan 1, 2019·5 cites·20 claims
- 1085US5729645AGraded index optical fibersUNIV PENNSYLVANIA·Filed 1996·Granted Mar 17, 1998·57 cites·29 claims
- 1184US12217094B1Method of resource adjustment for service cluster, electronic device and storage mediumNAT UNIV SINGAPORE·Filed 2024·Granted Feb 4, 2025·1 cites·20 claims
- 1284US11257207B2Inspection of reticles using machine learningKLA TENCOR CORP·Filed 2018·Granted Feb 22, 2022·4 cites·21 claims
- 1382US11733605B2EUV in-situ linearity calibration for TDI image sensors using test photomasksKLA CORP·Filed 2020·Granted Aug 22, 2023·1 cites·11 claims
- 1479US11112691B2Inspection system with non-circular pupilKLA TENCOR CORP·Filed 2019·Granted Sep 7, 2021·2 cites·36 claims
- 1579US9863761B2Critical dimension uniformity monitoring for extreme ultraviolet reticlesKLA TENCOR CORP·Filed 2013·Granted Jan 9, 2018·5 cites·18 claims
- 1677US2023341760A1EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test PhotomasksKLA CORP·Filed 2023·Application pending·0 cites
- 1775US10304180B2Apparatus and methods for predicting wafer-level defect printabilityKLA TENCOR CORP·Filed 2017·Granted May 28, 2019·1 cites·22 claims
- 1869US9766185B2Block-to-block reticle inspectionKLA TENCOR CORP·Filed 2014·Granted Sep 19, 2017·1 cites·15 claims
- 1969US8855400B2Detection of thin lines for selective sensitivity during reticle inspection using processed imagesWANG ZHENGYU·Filed 2012·Granted Oct 7, 2014·3 cites·21 claims
- 2068US12094101B2Inspection of reticles using machine learningKLA TENCOR CORP·Filed 2021·Granted Sep 17, 2024·0 cites·19 claims
- 2168US12092814B2Correcting aberration and apodization of an optical system using correction platesKLA CORP·Filed 2022·Granted Sep 17, 2024·0 cites·38 claims
- 2268US11854240B2Vision based target tracking that distinguishes facial feature targetsDEEPNORTH INC·Filed 2020·Granted Dec 26, 2023·0 cites·19 claims
- 2368US9612541B2Qualifying patterns for microlithographyKLA TENCOR CORP·Filed 2014·Granted Apr 4, 2017·1 cites·25 claims
- 2466US9778207B2Integrated multi-pass inspectionKLA TENCOR CORP·Filed 2014·Granted Oct 3, 2017·1 cites·37 claims
- 2566US9733640B2Method and apparatus for database-assisted requalification reticle inspectionKLA TENCOR CORP·Filed 2012·Granted Aug 15, 2017·1 cites·25 claims
- 2665US12006451B2Two-component solvent-less adhesive compositionDOW GLOBAL TECHNOLOGIES LLC·Filed 2018·Granted Jun 11, 2024·0 cites·16 claims
- 2764US7546573B1Semiconductor device pattern generationKLA TENCOR CORP·Filed 2006·Granted Jun 9, 2009·3 cites·5 claims
- 2864US2024353318A1Methods of imaging path polarization control for defect detection sensitivity enhancementKLA CORP·Filed 2024·Application pending·0 cites
- 2963US11442021B2Broadband light interferometry for focal-map generation in photomask inspectionKLA CORP·Filed 2020·Granted Sep 13, 2022·0 cites·22 claims
- 3060US9092847B2Detection of thin lines for selective sensitivity during reticle inspection using processed imagesKLA TENCOR CORP·Filed 2014·Granted Jul 28, 2015·0 cites·18 claims
- 3160US2025390013A1Deep-black borders on euv reticles with blazed gratingsKLA CORP·Filed 2024·Application pending·0 cites
- 3259US5911025AMethod for the preparation of optical fibersUNIV PENNSYLVANIA·Filed 1998·Granted Jun 8, 1999·22 cites·3 claims
- 3358US10539512B2Block-to-block reticle inspectionKLA TENCOR CORP·Filed 2017·Granted Jan 21, 2020·0 cites·15 claims
- 3458US10288415B2Critical dimension uniformity monitoring for extreme ultra-violet reticlesKLA TENCOR CORP·Filed 2017·Granted May 14, 2019·0 cites·10 claims
- 3558US10140698B2Polygon-based geometry classification for semiconductor mask inspectionKLA TENCOR CORP·Filed 2016·Granted Nov 27, 2018·1 cites·20 claims
- 3657US12367096B2Service control method based on service cluster, electronic device and storage mediumNAT UNIV SINGAPORE·Filed 2024·Granted Jul 22, 2025·0 cites·20 claims
- 3757US2023357614A1Two-component solventless adhesive compositions and methods of making sameDOW GLOBAL TECHNOLOGIES LLC·Filed 2020·Application pending·0 cites
- 3857US2009220969A1Identifying and quantifying small RNAsUNIV NORTH CAROLINA STATE·Filed 2008·Application pending·0 cites
- 3956US11469571B2Fast phase-shift interferometry by laser frequency shiftKLA CORP·Filed 2020·Granted Oct 11, 2022·0 cites·24 claims
- 4056US2025021550A1Database-based data query method, apparatus, electronic device and storage mediumBEIJING VOLCANO ENGINE TECHNOLOGY CO LTD·Filed 2024·Application pending·0 cites
- 4155US2023312806A1Isocyanate compounds and adhesive compositions comprising the sameDOW GLOBAL TECHNOLOGIES LLC·Filed 2020·Application pending·0 cites
- 4255US2025077514A1Data reading method and device for database, and storage mediumBEIJING VOLCANO ENGINE TECHNOLOGY CO LTD·Filed 2024·Application pending·0 cites
- 4355US2025165861A1Model training system, model training method and apparatusBEIJING VOLCANO ENGINE TECHNOLOGY CO LTD·Filed 2023·Application pending·0 cites
- 4455US2025111226A1Model training methods and apparatusBEIJING VOLCANO ENGINE TECHNOLOGY CO LTD·Filed 2023·Application pending·0 cites
- 4554US12386828B2Query task execution method, apparatus, computer device and storage mediumBEIJING VOLCANO ENGINE TECHNOLOGY CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·17 claims
- 4654US2025259343A1Workflow processing management for text-to-image generation using a diffusion modelBYTEDANCE TECH LTD·Filed 2025·Application pending·0 cites
- 4754US2025045101A1Slow node detection method during task running, apparatus, electronic device, and mediumNAT UNIV SINGAPORE·Filed 2024·Application pending·0 cites
- 4854US2025265275A1Hybrid clustering for streaming graphsBYTEDANCE TECH LTD·Filed 2025·Application pending·0 cites
- 4953US12147432B2Hybrid data processing system and methodLEMON INC·Filed 2021·Granted Nov 19, 2024·0 cites·18 claims
- 5053US2024218220A1Moisture resistant two-component adhesive compositionDOW GLOBAL TECHNOLOGIES LLC·Filed 2021·Application pending·0 cites
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →