Inventor · disambiguated record
Ryo Tajima
Also filed as: TAJIMA RYO
17 granted patents·3 pending applications·268 citations·filing 2004–2023
92Inventor score
Top patents by PatentIndex Score
20 records- 0198US7138629B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2004·Granted Nov 21, 2006·151 cites·22 claims
- 0297US7741601B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2008·Granted Jun 22, 2010·36 cites·13 claims
- 0397US7365324B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2006·Granted Apr 29, 2008·49 cites·7 claims
- 0494US8946631B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2014·Granted Feb 3, 2015·11 cites·14 claims
- 0586US9406480B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusEBARA CORP·Filed 2015·Granted Aug 2, 2016·3 cites·14 claims
- 0686US7934461B2Sewing machine capable of sewing sequins and method for setting sequin feed amount thereforTOKAI IND SEWING MACHINE·Filed 2006·Granted May 3, 2011·10 cites·7 claims
- 0783US8742341B2Testing apparatus using charged particles and device manufacturing method using the testing apparatusNOJI NOBUHARU·Filed 2010·Granted Jun 3, 2014·4 cites·13 claims
- 0866US8013315B2Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using sameEBARA CORP·Filed 2007·Granted Sep 6, 2011·2 cites·28 claims
- 0960US11515118B2Electron beam irradiation apparatus and electron beam alignment methodEBARA CORP·Filed 2020·Granted Nov 29, 2022·0 cites·6 claims
- 1060US2023393085A1Method of evaluating primary optical system of electron beam observation device, evaluation device used therefor, and method of manufacturing sameEBARA CORP·Filed 2023·Application pending·0 cites
- 1154US11217421B2Adjustment method and electron beam deviceEBARA CORP·Filed 2020·Granted Jan 4, 2022·0 cites·5 claims
- 1253US8256362B2Embroidery sewing machine and control method thereforTAJIMA RYO·Filed 2008·Granted Sep 4, 2012·2 cites·5 claims
- 1350US9105445B2Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recordedEBARA CORP·Filed 2014·Granted Aug 11, 2015·0 cites·19 claims
- 1449US12243710B2Electron beam irradiation apparatus with overlapping beam columns and helping columnsEBARA CORP·Filed 2020·Granted Mar 4, 2025·0 cites·7 claims
- 1548US10002740B2Inspection deviceEBARA CORP·Filed 2017·Granted Jun 19, 2018·0 cites·13 claims
- 1647US10707048B2Deflection sensitivity calculation method and deflection sensitivity calculation systemEBARA CORP·Filed 2019·Granted Jul 7, 2020·0 cites·16 claims
- 1746US10446404B2Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatusEBARA CORP·Filed 2018·Granted Oct 15, 2019·0 cites·7 claims
- 1844US9852878B2Surface processing apparatusEBARA CORP·Filed 2015·Granted Dec 26, 2017·0 cites·8 claims
- 1943US2009152595A1Semiconductor devices and method of testing sameEBARA CORP·Filed 2006·Application pending·0 cites
- 2040US2012234224A1Embroidery sewing machineTAJIMA RYO·Filed 2012·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ryo Tajima files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →