Inventor · disambiguated record
Sameet K. Shriyan
Also filed as: SHRIYAN SAMEET · SHRIYAN SAMEET K
8 granted patents·3 pending applications·12 citations·filing 2011–2024
77Inventor score
Top patents by PatentIndex Score
11 records- 0187US12165831B2Method and system of image-forming multi-electron beamsKLA CORP·Filed 2022·Granted Dec 10, 2024·1 cites·22 claims
- 0287US10018579B1System and method for cathodoluminescence-based semiconductor wafer defect inspectionKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·6 cites·24 claims
- 0378US9752932B2Tunable electro-optic filter stackFONTECCHIO ADAM K·Filed 2011·Granted Sep 5, 2017·5 cites·17 claims
- 0462US11651934B2Systems and methods of creating multiple electron beamsKLA CORP·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 0561US10175106B2Tunable electro-optic filter stackUNIV DREXEL·Filed 2017·Granted Jan 8, 2019·0 cites·18 claims
- 0657US2025273424A1Use of multiple electron beams for high throughput inspectionKLA CORP·Filed 2024·Application pending·0 cites
- 0756US2024355579A1Height sensing system for electron beam metrology toolKLA CORP·Filed 2023·Application pending·0 cites
- 0854US11615939B2Shaped aperture set for multi-beam array configurationsKLA CORP·Filed 2021·Granted Mar 28, 2023·0 cites·18 claims
- 0951US2023003615A1System and method of fiber location mapping in a multi-beam systemKLA CORP·Filed 2022·Application pending·0 cites
- 1048US10340114B1Method of eliminating thermally induced beam drift in an electron beam separatorKLA TENCOR CORP·Filed 2018·Granted Jul 2, 2019·0 cites·13 claims
- 1140US10224177B2Method and system for aberration correction in an electron beam systemKLA TENCOR CORP·Filed 2016·Granted Mar 5, 2019·0 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →