Inventor · disambiguated record
Satoshi Tomimatsu
Also filed as: TOMIMATSU SATOSHI
72 granted patents·8 pending applications·1,761 citations·filing 1997–2021
99Inventor score
Files withHITACHI LTD31HITACHI HIGH TECH CORP15HITACHI HIGH TECH SCIENCE CORP12SHICHI HIROYASU6KITAYAMA SHINYA3
Top patents by PatentIndex Score
80 records- 0199US8779400B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 15, 2014·91 cites·12 claims
- 0299US6664552B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2001·Granted Dec 16, 2003·139 cites·2 claims
- 0398US7138628B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Nov 21, 2006·35 cites·24 claims
- 0498US6734687B1Apparatus for detecting defect in device and method of detecting defectHITACHI LTD·Filed 2000·Granted May 11, 2004·134 cites·10 claims
- 0598US6538254B1Method and apparatus for sample fabricationHITACHI LTD·Filed 1998·Granted Mar 25, 2003·315 cites·19 claims
- 0697US7071475B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Jul 4, 2006·61 cites·8 claims
- 0797US6828566B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Dec 7, 2004·62 cites·24 claims
- 0897US6781125B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2001·Granted Aug 24, 2004·114 cites·14 claims
- 0996US7326942B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2005·Granted Feb 5, 2008·24 cites·16 claims
- 1096US7205560B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·32 cites·27 claims
- 1196US7205554B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2005·Granted Apr 17, 2007·34 cites·5 claims
- 1296US7176458B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Feb 13, 2007·18 cites·13 claims
- 1395US7700931B2Ion beam processing apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 20, 2010·20 cites·9 claims
- 1495US7550750B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Jun 23, 2009·26 cites·32 claims
- 1595US7525108B2Focused ion beam apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Apr 28, 2009·16 cites·30 claims
- 1695US7397050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·25 claims
- 1795US7397052B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·11 claims
- 1895US6927391B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2004·Granted Aug 9, 2005·69 cites·4 claims
- 1995US6858851B2Apparatus for specimen fabrication and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2003·Granted Feb 22, 2005·57 cites·12 claims
- 2094US8115184B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2008·Granted Feb 14, 2012·20 cites·15 claims
- 2194US7897936B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Mar 1, 2011·15 cites·15 claims
- 2294US7470918B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 30, 2008·22 cites·15 claims
- 2394US7465945B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Dec 16, 2008·20 cites·7 claims
- 2493US9620333B2Charged particle beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Apr 11, 2017·9 cites·7 claims
- 2593US8481980B2Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sampleSHICHI HIROYASU·Filed 2008·Granted Jul 9, 2013·17 cites·11 claims
- 2692US7888639B2Method and apparatus for processing a micro sampleHITACHI LTD·Filed 2007·Granted Feb 15, 2011·14 cites·2 claims
- 2792US7397051B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·8 cites·9 claims
- 2892US6960765B2Probe driving method, and probe apparatusHITACHI ULSI SYS CO LTD·Filed 2001·Granted Nov 1, 2005·50 cites·7 claims
- 2992US6794663B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Sep 21, 2004·33 cites·9 claims
- 3091US8569719B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Oct 29, 2013·6 cites·18 claims
- 3191US7952083B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2008·Granted May 31, 2011·11 cites·6 claims
- 3290US7268356B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Sep 11, 2007·28 cites·13 claims
- 3389US8222618B2Method and apparatus for processing a microsampleTOKUDA MITSUO·Filed 2011·Granted Jul 17, 2012·9 cites·18 claims
- 3489US7482603B2Apparatus and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2006·Granted Jan 27, 2009·10 cites·22 claims
- 3588US8618520B2Method and apparatus for processing a micro sampleTOKUDA MITSUO·Filed 2012·Granted Dec 31, 2013·7 cites·24 claims
- 3688US6583426B1Projection ion beam machining apparatusHITACHI LTD·Filed 1997·Granted Jun 24, 2003·56 cites·12 claims
- 3787US9202672B2Apparatus and method for probe shape processing by ion beamKITAYAMA SHINYA·Filed 2011·Granted Dec 1, 2015·12 cites·12 claims
- 3886US8450699B2Electron beam device and electron beam application device using the sameOHSHIMA TAKASHI·Filed 2009·Granted May 28, 2013·10 cites·14 claims
- 3986US8405053B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Mar 26, 2013·4 cites·3 claims
- 4086US7999240B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Aug 16, 2011·4 cites·14 claims
- 4185US10236159B2Charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Mar 19, 2019·3 cites·12 claims
- 4285US6627889B2Apparatus and method for observing sample using electron beamHITACHI LTD·Filed 2002·Granted Sep 30, 2003·21 cites·4 claims
- 4384US7791050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 4484US7372050B2Method of preventing charging, and apparatus for charged particle beam using the sameHITACHI LTD·Filed 2005·Granted May 13, 2008·5 cites·10 claims
- 4579US7301146B2Probe driving method, and probe apparatusHITACHI LTD·Filed 2005·Granted Nov 27, 2007·8 cites·16 claims
- 4678US8431891B2Dual beam apparatus with tilting sample stageSHICHI HIROYASU·Filed 2010·Granted Apr 30, 2013·3 cites·20 claims
- 4778US6970004B2Apparatus for inspecting defects of devices and method of inspecting defectsHITACHI ULSI SYS CO LTD·Filed 2004·Granted Nov 29, 2005·18 cites·8 claims
- 4877US8796651B2Method and apparatus for specimen fabricationSHICHI HIROYASU·Filed 2011·Granted Aug 5, 2014·2 cites·12 claims
- 4977US7989782B2Apparatus and method for specimen fabricationHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·3 cites·17 claims
- 5074US8530865B2Gas field ion source, charged particle microscope, and apparatusSHICHI HIROYASU·Filed 2012·Granted Sep 10, 2013·2 cites·13 claims
Showing the top 50 of 80 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →