Inventor · disambiguated record
Scott E. Lindsey
Also filed as: LINDSEY SCOTT · LINDSEY SCOTT E
54 granted patents·11 pending applications·772 citations·filing 1992–2025
99Inventor score
Top patents by PatentIndex Score
65 records- 0198US11977098B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2023·Granted May 7, 2024·5 cites·22 claims
- 0298US11592465B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2021·Granted Feb 28, 2023·13 cites·11 claims
- 0398US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0498US11112429B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2019·Granted Sep 7, 2021·18 cites·8 claims
- 0598US10401385B2Limiting translation for consistent substrate-to-substrate contactAEHR TEST SYSTEMS·Filed 2017·Granted Sep 3, 2019·20 cites·20 claims
- 0698US9625521B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2014·Granted Apr 18, 2017·23 cites·5 claims
- 0797US9880197B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2017·Granted Jan 30, 2018·21 cites·10 claims
- 0897US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 0997US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 1097US8228085B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2010·Granted Jul 24, 2012·26 cites·22 claims
- 1197US8030957B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2009·Granted Oct 4, 2011·42 cites·14 claims
- 1296US11448695B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2020·Granted Sep 20, 2022·3 cites·35 claims
- 1396US9250291B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2012·Granted Feb 2, 2016·19 cites·22 claims
- 1496US8947116B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2011·Granted Feb 3, 2015·22 cites·12 claims
- 1596US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 1696US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 1795US7800382B2System for testing an integrated circuit of a device and its method of useAEHR Test Ststems·Filed 2007·Granted Sep 21, 2010·40 cites·26 claims
- 1894US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 1994US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 2094US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 2192US2025085337A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2292US2025085338A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2391US7131848B2Helical microelectronic contact and method for fabricating sameFORMFACTOR INC·Filed 2005·Granted Nov 7, 2006·24 cites·16 claims
- 2491US2024393387A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2591US2024402243A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2691US2025093398A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2791US2025093399A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2891US2024393388A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2991US2024410938A1System for testing an integrated circuit of a device and itsmethod of useAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3090US6948940B2Helical microelectronic contact and method for fabricating sameFORMFACTOR INC·Filed 2003·Granted Sep 27, 2005·55 cites·19 claims
- 3189US12298328B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2024·Granted May 13, 2025·0 cites·16 claims
- 3289US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 3389US6310403B1Method of manufacturing components and component thereofMOTOROLA INC·Filed 2000·Granted Oct 30, 2001·60 cites·41 claims
- 3488US12169217B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Dec 17, 2024·0 cites·10 claims
- 3587US5773986ASemiconductor wafer contact system and method for contacting a semiconductor waferMOTOROLA INC·Filed 1995·Granted Jun 30, 1998·65 cites·5 claims
- 3685US11821940B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Nov 21, 2023·0 cites·9 claims
- 3784US2025224423A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 3883US12326472B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2022·Granted Jun 10, 2025·0 cites·12 claims
- 3983US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 4082US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 4182US7053644B1System for testing and burning in of integrated circuitsAEHR TEST SYSTEMS·Filed 2004·Granted May 30, 2006·34 cites·26 claims
- 4281US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 4380US11635459B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 4480US10649022B2Electronics testerAEHR TEST SYSTEMS·Filed 2018·Granted May 12, 2020·1 cites·13 claims
- 4579US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 4678US5629630ASemiconductor wafer contact system and method for contacting a semiconductor waferMOTOROLA INC·Filed 1995·Granted May 13, 1997·54 cites·27 claims
- 4775US10976362B2Electronics tester with power saving stateAEHR TEST SYSTEMS·Filed 2020·Granted Apr 13, 2021·0 cites·11 claims
- 4874US11199572B2Electronics testerAEHR TEST SYSTEMS·Filed 2020·Granted Dec 14, 2021·0 cites·14 claims
- 4972US10718808B2Electronics tester with current amplificationAEHR TEST SYSTEMS·Filed 2018·Granted Jul 21, 2020·0 cites·9 claims
- 5072US5217568ASilicon etching process using polymeric mask, for example, to form V-groove for an optical fiber couplingMOTOROLA INC·Filed 1992·Granted Jun 8, 1993·57 cites·15 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →