Inventor · disambiguated record
Sebastian Giessmann
Also filed as: GIESSMANN SEBASTIAN
14 granted patents·2 pending applications·12 citations·filing 2007–2024
85Inventor score
Files withMPI CORP11CASCADE MICROTECH INC2SUSS MICROTEC TECH SYSTEMS GMB1SUSS MICROTEC TEST SYS GMBH1WERNER FRANK-MICHAEL1
Top patents by PatentIndex Score
16 records- 0169US7671615B2Method and apparatus for controlling the temperature of electronic componentsSUSS MICROTEC TECH SYSTEMS GMB·Filed 2007·Granted Mar 2, 2010·6 cites·25 claims
- 0268US2025102539A1Probe system and machine apparatus thereofMPI CORP·Filed 2024·Application pending·0 cites
- 0365US8841932B2Prober for testing devices in a repeat structure on a substrateWERNER FRANK-MICHAEL·Filed 2011·Granted Sep 23, 2014·2 cites·15 claims
- 0464US12196808B2Motorized chuck stage controlling methodMPI CORP·Filed 2023·Granted Jan 14, 2025·0 cites·18 claims
- 0563US11703541B2Semiconductor inspecting method for ensuring scrubbing length on padMPI CORP·Filed 2021·Granted Jul 18, 2023·0 cites·7 claims
- 0663US11693050B2Semiconductor inspecting methodMPI CORP·Filed 2021·Granted Jul 4, 2023·0 cites·5 claims
- 0762US12196779B2Probe system and machine apparatus thereofMPI CORP·Filed 2022·Granted Jan 14, 2025·0 cites·17 claims
- 0859US12092658B2Optical detection system and alignment method for a predetermined target objectMPI CORP·Filed 2022·Granted Sep 17, 2024·0 cites·10 claims
- 0959US7741860B2Prober for testing magnetically sensitive componentsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 22, 2010·4 cites·12 claims
- 1054US9983232B2Prober for testing devices in a repeat structure on a substrateCASCADE MICROTECH INC·Filed 2014·Granted May 29, 2018·0 cites·9 claims
- 1154US2025147067A1Probe system for double side probing, method of operating the same and tested deviceMPI CORP·Filed 2024·Application pending·0 cites
- 1249US10895587B2Wafer probe stationMPI CORP·Filed 2018·Granted Jan 19, 2021·0 cites·13 claims
- 1345US11313883B2Probe station capable of maintaining position of probe tip upon temperature changeMPI CORP·Filed 2020·Granted Apr 26, 2022·0 cites·16 claims
- 1444US10996239B1Method of positioning probe tips relative to padsMPI CORP·Filed 2020·Granted May 4, 2021·0 cites·15 claims
- 1543US7932737B2Prober for testing devices in a repeat structure on a substrateCASCADE MICROTECH INC·Filed 2008·Granted Apr 26, 2011·0 cites·9 claims
- 1639US12007319B2Optical path correction subassembly, optical detection assembly, and optical detection systemMPI CORP·Filed 2022·Granted Jun 11, 2024·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →