Inventor · disambiguated record
Seiji Ichiyoshi
Also filed as: ICHIYOSHI SEIJI
2 granted patents·3 pending applications·23 citations·filing 2003–2007
61Inventor score
Technology areasG01R
Files withADVANTEST CORP4
Top patents by PatentIndex Score
5 records- 0165US7290192B2Test apparatus and test method for testing plurality of devices in parallelADVANTEST CORP·Filed 2003·Granted Oct 30, 2007·14 cites·8 claims
- 0256US7272765B2Test apparatus and test method for testing plurality of devices in parallelADVANTEST CORP·Filed 2004·Granted Sep 18, 2007·9 cites·2 claims
- 0341US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0441US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0533US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →