Inventor · disambiguated record
Shuusuke Kantake
Also filed as: KANTAKE SHUUSUKE
2 granted patents·1 pending application·16 citations·filing 2003–2007
58Inventor score
Files withADVANTEST CORP3
Top patents by PatentIndex Score
3 records- 0176US7382117B2Delay circuit and test apparatus using delay element and bufferADVANTEST CORP·Filed 2005·Granted Jun 3, 2008·9 cites·9 claims
- 0247US7107166B2Device for testing LSI to be measured, jitter analyzer, and phase difference detectorADVANTEST CORP·Filed 2003·Granted Sep 12, 2006·7 cites·11 claims
- 0339US2008258714A1Delay circuit and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →