Inventor · disambiguated record
Shuen-Cheng Lei
Also filed as: LEI SHUEN-CHENG
3 granted patents·2 pending applications·11 citations·filing 2008–2010
63Inventor score
Files withCHOU LING-CHUN1HUANG PONG-WEY1KUO CHIEN-LI1UNITED MICROELECTRONICS CORP1UNITED MICROLELECTRONICS CORP1
Top patents by PatentIndex Score
5 records- 0179US7817265B2Alignment mark and defect inspection methodUNITED MICROELECTRONICS CORP·Filed 2008·Granted Oct 19, 2010·6 cites·10 claims
- 0274US8516400B2Method for predicting tolerable spacing between conductors in semiconductor processKUO CHIEN-LI·Filed 2010·Granted Aug 20, 2013·4 cites·20 claims
- 0351US8487644B2Method and pattern carrier for optimizing inspection recipe of defect inspection toolHUANG PONG-WEY·Filed 2010·Granted Jul 16, 2013·1 cites·11 claims
- 0441US2010327451A1Alignment markCHOU LING-CHUN·Filed 2010·Application pending·0 cites
- 0541US2010308220A1Inspection structure and method for in-line monitoring waferUNITED MICROLELECTRONICS CORP·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →