Inventor · disambiguated record
Shifang Li
Also filed as: LI SHIFANG
101 granted patents·8 pending applications·766 citations·filing 1997–2024
99Inventor score
Files withGM GLOBAL TECH OPERATIONS LLC32TOKYO ELECTRON LTD27TIMBRE TECH INC14KLA TENCOR CORP12LI SHIFANG6
Top patents by PatentIndex Score
109 records- 0198US9938908B2System and method for predicting a pedal position based on driver behavior and controlling one or more engine actuators based on the predicted pedal positionGM GLOBAL TECH OPERATIONS LLC·Filed 2016·Granted Apr 10, 2018·15 cites·20 claims
- 0296US10443530B1System with solenoid assembly and method of fault diagnosis and isolationGM GLOBAL TECH OPERATIONS LLC·Filed 2018·Granted Oct 15, 2019·12 cites·20 claims
- 0396US9709543B2Method and apparatus for determining NOx content in an exhaust gas feedstream of an internal combustion engineGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Jul 18, 2017·11 cites·18 claims
- 0496US8289527B2Optimization of ray tracing and beam propagation parametersLI SHIFANG·Filed 2010·Granted Oct 16, 2012·20 cites·19 claims
- 0595US10399492B1Automatic reconfiguration and calibration of haptic seatsGM GLOBAL TECH OPERATIONS LLC·Filed 2018·Granted Sep 3, 2019·14 cites·20 claims
- 0695US10259448B2Hybrid vehicle propulsion systems and methodsGM GLOBAL TECH OPERATIONS LLC·Filed 2016·Granted Apr 16, 2019·20 cites·19 claims
- 0795US7394535B1Optical metrology using a photonic nanojetTOKYO ELECTRON LTD·Filed 2007·Granted Jul 1, 2008·37 cites·20 claims
- 0895US7372583B1Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2007·Granted May 13, 2008·22 cites·23 claims
- 0994US11362524B2Battery system and a method for use in the battery systemGM GLOBAL TECH OPERATIONS LLC·Filed 2020·Granted Jun 14, 2022·6 cites·20 claims
- 1094US10442443B1Providing driver feedbackGM GLOBAL TECH OPERATIONS LLC·Filed 2018·Granted Oct 15, 2019·18 cites·17 claims
- 1194US7280229B2Examining a structure formed on a semiconductor wafer using machine learning systemsTIMBRE TECH INC·Filed 2004·Granted Oct 9, 2007·51 cites·24 claims
- 1294US7064829B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2003·Granted Jun 20, 2006·47 cites·29 claims
- 1393US11221300B2Determining metrology-like information for a specimen using an inspection toolKLA CORP·Filed 2021·Granted Jan 11, 2022·2 cites·25 claims
- 1493US10604038B2Reconfigurable vehicle seat for childrenGM GLOBAL TECH OPERATIONS LLC·Filed 2018·Granted Mar 31, 2020·11 cites·20 claims
- 1592US7224471B2Azimuthal scanning of a structure formed on a semiconductor waferTIMBRE TECH INC·Filed 2003·Granted May 29, 2007·45 cites·23 claims
- 1691US10675991B2Methods for reconfigurable battery charger controlGM GLOBAL TECH OPERATIONS LLC·Filed 2018·Granted Jun 9, 2020·9 cites·10 claims
- 1791US9803532B2Predictive control of ammonia storage in a selective catalytic reduction device using connectivity informationGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Oct 31, 2017·6 cites·11 claims
- 1891US9709386B1Apparatus and methods for measuring properties in a TSV structure using beam profile reflectometryKLA TENCOR CORP·Filed 2016·Granted Jul 18, 2017·10 cites·17 claims
- 1991US7588949B2Optical metrology model optimization based on goalsTOKYO ELECTRON LTD·Filed 2007·Granted Sep 15, 2009·11 cites·23 claims
- 2090US10563973B2All surface film metrology systemKLA TENCOR CORP·Filed 2016·Granted Feb 18, 2020·11 cites·16 claims
- 2190US7636649B2Automated process control of a fabrication tool using a dispersion function relating process parameter to dispersionTOKYO ELECTRON LTD·Filed 2007·Granted Dec 22, 2009·16 cites·18 claims
- 2290US7567352B2Controlling a fabrication tool using support vector machineTOKYO ELECTRON LTD·Filed 2008·Granted Jul 28, 2009·10 cites·23 claims
- 2389US8570531B2Method of regenerating diffraction signals for optical metrology systemsLI SHIFANG·Filed 2011·Granted Oct 29, 2013·8 cites·20 claims
- 2488US9863756B1Line scan spectroscopic white light interferometry for semiconductor inspection and metrologyKLA TENCOR CORP·Filed 2015·Granted Jan 9, 2018·5 cites·13 claims
- 2588US8812277B2Method of enhancing an optical metrology system using ray tracing and flexible ray librariesLI SHIFANG·Filed 2011·Granted Aug 19, 2014·10 cites·22 claims
- 2688US7271902B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2006·Granted Sep 18, 2007·9 cites·20 claims
- 2787US7617075B2Library accuracy enhancment and evaluationTOKYO ELECTRON LTD·Filed 2007·Granted Nov 10, 2009·7 cites·20 claims
- 2887US7523439B2Determining position accuracy of double exposure lithography using optical metrologyTOKYO ELECTRON LTD·Filed 2006·Granted Apr 21, 2009·9 cites·19 claims
- 2987US7355728B2Optical metrology model optimization for repetitive structuresTIMBRE TECH INC·Filed 2005·Granted Apr 8, 2008·20 cites·33 claims
- 3086US11451071B2Battery electric vehicle energy storage system and methodGM GLOBAL TECH OPERATIONS LLC·Filed 2020·Granted Sep 20, 2022·2 cites·19 claims
- 3186US9927780B2System and method for adjusting target actuator values of an engine using model predictive control to satisfy emissions and drivability targets and maximize fuel efficiencyGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Mar 27, 2018·12 cites·20 claims
- 3286US7428060B2Optimization of diffraction order selection for two-dimensional structuresTIMBRE TECH INC·Filed 2006·Granted Sep 23, 2008·17 cites·41 claims
- 3386US7302367B2Library accuracy enhancement and evaluationTIMBRE TECH INC·Filed 2006·Granted Nov 27, 2007·14 cites·22 claims
- 3485US10981557B2Battery pack balancing systems and control logic for multi-pack electric-drive motor vehiclesGM GLOBAL TECH OPERATIONS LLC·Filed 2019·Granted Apr 20, 2021·5 cites·20 claims
- 3585US9640449B2Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopyKLA TENCOR CORP·Filed 2015·Granted May 2, 2017·5 cites·21 claims
- 3684US7414733B2Azimuthal scanning of a structure formed on a semiconductor waferTIMBRE TECH INC·Filed 2007·Granted Aug 19, 2008·7 cites·18 claims
- 3783US11358486B2Electric powertrain with multi-pack battery systemGM GLOBAL TECH OPERATIONS LLC·Filed 2019·Granted Jun 14, 2022·4 cites·20 claims
- 3883US9747520B2Systems and methods for enhancing inspection sensitivity of an inspection toolKLA TENCOR CORP·Filed 2016·Granted Aug 29, 2017·5 cites·17 claims
- 3983US9115987B2Optical metrology with multiple angles of incidence and/or azimuth anglesNANOMETRICS INC·Filed 2013·Granted Aug 25, 2015·7 cites·25 claims
- 4082US7450232B2Generic interface for an optical metrology systemTIMBRE TECH INC·Filed 2007·Granted Nov 11, 2008·9 cites·20 claims
- 4181US8838422B2Process control using ray tracing-based libraries and machine learning systemsLI SHIFANG·Filed 2011·Granted Sep 16, 2014·6 cites·21 claims
- 4280US9482164B2Engine control using calculated cylinder air chargeGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Nov 1, 2016·2 cites·18 claims
- 4380US9059038B2System for in-situ film stack measurement during etching and etch control methodTOKYO ELECTRON LTD·Filed 2013·Granted Jun 16, 2015·5 cites·10 claims
- 4480US7627392B2Automated process control using parameters determined with approximation and fine diffraction modelsTOKYO ELECTRON LTD·Filed 2007·Granted Dec 1, 2009·12 cites·20 claims
- 4580US7474420B2In-die optical metrologyTIMBRE TECH INC·Filed 2006·Granted Jan 6, 2009·11 cites·34 claims
- 4679US8980651B2Overlay measurement for a double patterningYUE HONGYU HENRY·Filed 2011·Granted Mar 17, 2015·4 cites·18 claims
- 4778US9909481B2System and method for determining target actuator values of an engine using model predictive control while satisfying emissions and drivability targets and maximizing fuel efficiencyGM GLOBAL TECH OPERATIONS LLC·Filed 2015·Granted Mar 6, 2018·2 cites·20 claims
- 4877US9658150B2System and method for semiconductor wafer inspection and metrologyKLA TENCOR CORP·Filed 2016·Granted May 23, 2017·2 cites·20 claims
- 4977US7961306B2Optimizing sensitivity of optical metrology measurementsTOKYO ELECTRON LTD·Filed 2009·Granted Jun 14, 2011·9 cites·20 claims
- 5077US7912679B2Determining profile parameters of a structure formed on a semiconductor wafer using a dispersion function relating process parameter to dispersionTOKYO ELECTRON LTD·Filed 2007·Granted Mar 22, 2011·5 cites·17 claims
Showing the top 50 of 109 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →