Inventor · disambiguated record
Shay Wolfling
Also filed as: WOLFLING SHAY
11 granted patents·5 pending applications·99 citations·filing 1998–2024
89Inventor score
Top patents by PatentIndex Score
16 records- 0186US10876959B2Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2018·Granted Dec 29, 2020·2 cites·3 claims
- 0284US11885737B2Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2020·Granted Jan 30, 2024·1 cites·8 claims
- 0384US7609388B2Spatial wavefront analysis and 3D measurementICOS VISION SYSTEMS NV·Filed 2002·Granted Oct 27, 2009·28 cites·74 claims
- 0484US7327470B2Spatial and spectral wavefront analysis and measurementICOS VISION SYSTEMS NV·Filed 2004·Granted Feb 5, 2008·14 cites·6 claims
- 0584US2024337590A1Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2024·Application pending·0 cites
- 0680US10209206B2Method and system for determining strain distribution in a sampleNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 19, 2019·6 cites·14 claims
- 0777US7542144B2Spatial and spectral wavefront analysis and measurementICOS VISION SYSTEMS NV·Filed 2007·Granted Jun 2, 2009·4 cites·2 claims
- 0874US6819435B2Spatial and spectral wavefront analysis and measurementNANO OR TECHNOLOGIES INC·Filed 2001·Granted Nov 16, 2004·16 cites·248 claims
- 0968US10054423B2Optical method and system for critical dimensions and thickness characterizationNOVA MEASURING INSTR LTD·Filed 2013·Granted Aug 21, 2018·2 cites·15 claims
- 1063US2015316468A1Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2014·Application pending·0 cites
- 1159US6707608B1Diffractive optical element and a method for producing sameNANO OR TECHNOLOGIES ISRAEL LT·Filed 1998·Granted Mar 16, 2004·26 cites·66 claims
- 1242US2017018069A1Hybrid metrology techniqueGLOBALFOUNDRIES INC·Filed 2014·Application pending·0 cites
- 1341US2011149298A1Spatial wavefront analysis and 3d measurementICOS VISION SYSTEMS NV·Filed 2009·Application pending·0 cites
- 1438US2004081033A1Multiple layer optical storage deviceFiled 2002·Application pending·0 cites
- 1532US10311198B2Overlay design optimizationNOVA MEASURING INSTR LTD·Filed 2015·Granted Jun 4, 2019·0 cites·13 claims
- 1631US8319975B2Methods and apparatus for wavefront manipulations and improved 3-D measurementsARIELI YOEL·Filed 2005·Granted Nov 27, 2012·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →