Inventor · disambiguated record
Shay Yogev
Also filed as: YOGEV SHAY
9 granted patents·3 pending applications·7 citations·filing 2017–2025
80Inventor score
Top patents by PatentIndex Score
12 records- 0193US11763181B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2021·Granted Sep 19, 2023·3 cites·20 claims
- 0280US12236364B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2023·Granted Feb 25, 2025·0 cites·18 claims
- 0376US12321102B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2023·Granted Jun 3, 2025·0 cites·18 claims
- 0476US2025334887A1Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2025·Application pending·0 cites
- 0575US11093840B2Metrology and process control for semiconductor manufacturingNOVA MEASURING INSTR LTD·Filed 2019·Granted Aug 17, 2021·1 cites·16 claims
- 0675US2025181941A1Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2025·Application pending·0 cites
- 0773US11107738B2Layer detection for high aspect ratio etch controlNOVA LTD·Filed 2017·Granted Aug 31, 2021·2 cites·20 claims
- 0872US11300948B2Process control of semiconductor fabrication based on spectra quality metricsGLOBALFOUNDRIES INC·Filed 2019·Granted Apr 12, 2022·1 cites·20 claims
- 0965US11815819B2Machine and deep learning methods for spectra-based metrology and process controlNOVA LTD·Filed 2021·Granted Nov 14, 2023·0 cites·17 claims
- 1060US11929291B2Layer detection for high aspect ratio etch controlNOVA LTD·Filed 2021·Granted Mar 12, 2024·0 cites·9 claims
- 1147US12469124B2Machine learning based yield predictionAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 1236US2020279783A1Process control of semiconductor fabrication based on linkage between different fabrication stepsGLOBALFOUNDRIES INC·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →