Inventor · disambiguated record
Stuart L. Friedman
Also filed as: FRIEDMAN STUART · FRIEDMAN STUART L · FRIEDMAN STUART LAWRENCE
19 granted patents·1 pending application·577 citations·filing 1996–2020
95Inventor score
Top patents by PatentIndex Score
20 records- 0196US8629384B1Photomultiplier tube optimized for surface inspection in the ultravioletBIELLAK STEPHEN·Filed 2010·Granted Jan 14, 2014·42 cites·4 claims
- 0295US8160690B2System and method for determining electrode-tissue contact based on amplitude modulation of sensed signalWILFLEY BRIAN P·Filed 2007·Granted Apr 17, 2012·326 cites·23 claims
- 0393US10274413B2Beam shaping optics of flow cytometer systems and methods related theretoABBOTT LAB·Filed 2016·Granted Apr 30, 2019·4 cites·20 claims
- 0492US9523857B2Beam shaping optics of flow cytometer systems and methods related theretoABBOTT LAB·Filed 2014·Granted Dec 20, 2016·10 cites·20 claims
- 0592US7171038B2Method and apparatus for inspecting a substrateKLA TENCOR TECH CORP·Filed 2001·Granted Jan 30, 2007·42 cites·5 claims
- 0690US10274513B2Optically excited microwave impedance microscopyPRIMENANO INC·Filed 2017·Granted Apr 30, 2019·6 cites·22 claims
- 0789US10473694B2Optical source in microwave impedance microscopyPRIMENANO INC·Filed 2019·Granted Nov 12, 2019·5 cites·20 claims
- 0889US5798524AAutomated adjustment of an energy filtering transmission electron microscopeGATAN INC·Filed 1996·Granted Aug 25, 1998·71 cites·25 claims
- 0987US8489184B2System and method for determining electrode-tissue contact based on amplitude modulation of sensed signalWILFLEY BRIAN P·Filed 2012·Granted Jul 16, 2013·26 cites·26 claims
- 1085US10830686B2Beam shaping optics of flow cytometer systems and methods related theretoABBOTT LAB·Filed 2019·Granted Nov 10, 2020·1 cites·21 claims
- 1184US7570354B1Image intensification for low light inspectionKLA TENCOR CORP·Filed 2007·Granted Aug 4, 2009·9 cites·18 claims
- 1280US7635842B2Method and instrument for chemical defect characterization in high vacuumKLA TENCOR CORP·Filed 2008·Granted Dec 22, 2009·6 cites·24 claims
- 1378US9170503B2Method and apparatus for inspecting a substrateADLER DAVID·Filed 2006·Granted Oct 27, 2015·4 cites·11 claims
- 1475US11262288B2Beam shaping optics of flow cytometer systems and methods related theretoABBOTT LAB·Filed 2020·Granted Mar 1, 2022·0 cites·14 claims
- 1574US6717146B2Tandem microchannel plate and solid state electron detectorAPPLIED MATERIALS INC·Filed 2001·Granted Apr 6, 2004·11 cites·21 claims
- 1671US8237120B1Transverse focusing action in hyperbolic field detectorsTOTH GABOR·Filed 2009·Granted Aug 7, 2012·3 cites·13 claims
- 1770US9529279B2Method and apparatus for inspecting a substrateADLER DAVID·Filed 2006·Granted Dec 27, 2016·2 cites·6 claims
- 1869US6642637B1Parallel plate electron multiplierAPPLIED MATERIALS INC·Filed 2000·Granted Nov 4, 2003·8 cites·16 claims
- 1964US2017074810A1Method and apparatus for inspecting a substrateKLA TENCOR CORP·Filed 2016·Application pending·0 cites
- 2058US8941049B2Readout methodology for multi-channel acquisition of spatially distributed signalTOTH GABOR·Filed 2011·Granted Jan 27, 2015·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →