Inventor · disambiguated record
Tathagata Chatterjee
Also filed as: CHATTERJEE TATHAGATA
30 granted patents·6 pending applications·105 citations·filing 1997–2022
95Inventor score
Files withTEXAS INSTRUMENTS INC30EDWARDS HENRY LITZMANN2CHATTERJEE TATHAGATA1EDWARDS HENRY L1MCCANN & ASSOCIATES INC1
Top patents by PatentIndex Score
36 records- 0193US10236900B1Capacitive mismatch measurementTEXAS INSTRUMENTS INC·Filed 2017·Granted Mar 19, 2019·11 cites·12 claims
- 0289US9548298B1Method of improving bipolar device signal to noise performance by reducing the effect of oxide interface trapping centersTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 17, 2017·6 cites·8 claims
- 0384US7312481B2Reliable high-voltage junction field effect transistor and method of manufacture thereforTEXAS INSTRUMENTS INC·Filed 2004·Granted Dec 25, 2007·37 cites·32 claims
- 0483US9000505B2Quantum electro-optical device using CMOS transistor with reverse polarity drain implantEDWARDS HENRY L·Filed 2011·Granted Apr 7, 2015·9 cites·1 claims
- 0581US7859289B2Method for measuring interface traps in thin gate oxide MOSFETSTEXAS INSTRUMENTS INC·Filed 2010·Granted Dec 28, 2010·4 cites·14 claims
- 0679US10101382B2Systems and methods for dynamic Rdson measurementTEXAS INSTRUMENTS INC·Filed 2016·Granted Oct 16, 2018·2 cites·12 claims
- 0773US11796588B2Direct current measurement of 1/f transistor noiseTEXAS INSTRUMENTS INC·Filed 2021·Granted Oct 24, 2023·0 cites·16 claims
- 0873US7683364B2Gated quantum resonant tunneling diode using CMOS transistor with modified pocket and LDD implantsTEXAS INSTRUMENTS INC·Filed 2008·Granted Mar 23, 2010·5 cites·18 claims
- 0972US7910918B2Gated resonant tunneling diodeTEXAS INSTRUMENTS INC·Filed 2009·Granted Mar 22, 2011·4 cites·24 claims
- 1072US7466009B2Method for reducing dislocation threading using a suppression implantTEXAS INSTRUMENTS INC·Filed 2006·Granted Dec 16, 2008·3 cites·11 claims
- 1170US11296075B2High reliability polysilicon componentsTEXAS INSTRUMENTS INC·Filed 2018·Granted Apr 5, 2022·1 cites·21 claims
- 1268US8362462B2Gated resonant tunneling diodeTEXAS INSTRUMENTS INC·Filed 2011·Granted Jan 29, 2013·2 cites·18 claims
- 1367US11916067B2High reliability polysilicon componentsTEXAS INSTRUMENTS INC·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 1467US7595649B2Method to accurately estimate the source and drain resistance of a MOSFETTEXAS INSTRUMENTS INC·Filed 2007·Granted Sep 29, 2009·5 cites·13 claims
- 1566US8026507B2Two terminal quantum device using MOS capacitor structureTEXAS INSTRUMENTS INC·Filed 2009·Granted Sep 27, 2011·3 cites·16 claims
- 1662US7943450B2Gated resonant tunneling diodeTEXAS INSTRUMENTS INC·Filed 2009·Granted May 17, 2011·2 cites·23 claims
- 1761US11249130B2Direct current measurement of 1/f transistor noiseTEXAS INSTRUMENTS INC·Filed 2017·Granted Feb 15, 2022·0 cites·20 claims
- 1861US10571511B2Systems and methods for dynamic Rdson measurementTEXAS INSTRUMENTS INC·Filed 2018·Granted Feb 25, 2020·0 cites·15 claims
- 1957US7692217B2Matched analog CMOS transistors with extension wellsTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 6, 2010·1 cites·19 claims
- 2056US7638415B2Method for reducing dislocation threading using a suppression implantTEXAS INSTRUMENTS INC·Filed 2008·Granted Dec 29, 2009·0 cites·9 claims
- 2154US6867100B2System for high-precision double-diffused MOS transistorsTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 15, 2005·5 cites·10 claims
- 2252US2019181874A1Capacitive mismatch measurementTEXAS INSTRUMENTS INC·Filed 2019·Application pending·0 cites
- 2351US9818740B2Method of improving bipolar device signal to noise performance by reducing the effect of oxide interface trapping centersTEXAS INSTRUMENTS INC·Filed 2016·Granted Nov 14, 2017·0 cites·18 claims
- 2450US7615805B2Versatile system for optimizing current gain in bipolar transistor structuresTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 10, 2009·0 cites·9 claims
- 2548US7704813B2Reliable high-voltage junction field effect transistor and method of manufacturing thereforTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 27, 2010·0 cites·16 claims
- 2647US10748818B2Dynamic biasing to mitigate electrical stress in integrated resistorsTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 18, 2020·0 cites·8 claims
- 2745US12154841B2Nanoscale thermoelectric refrigeratorEDWARDS HENRY LITZMANN·Filed 2008·Granted Nov 26, 2024·0 cites·8 claims
- 2845US2009046823A1Neutron generating deviceTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 2943US2005127409A1System for high-precision double-diffused MOS transistorsFiled 2005·Application pending·0 cites
- 3043US2008096292A1Method for measuring interface traps in thin gate oxide MOSFETsTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 3140US2013255741A1Structure and method for coupling heat to an embedded thermoelectric deviceTEXAS INSTRUMENTS INC·Filed 2013·Application pending·0 cites
- 3239US7687856B2Body bias to facilitate transistor matchingTEXAS INSTRUMENTS INC·Filed 2007·Granted Mar 30, 2010·0 cites·12 claims
- 3338US2007210453A1Dummy-fill-structure placement for improved device feature location and access for integrated circuit failure analysisTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 3437US9484435B2MOS transistor with varying channel widthEDWARDS HENRY LITZMANN·Filed 2007·Granted Nov 1, 2016·0 cites·6 claims
- 3536US5932964AEuropium-containing group IIA fluoride epitaxial layer on siliconMCCANN & ASSOCIATES INC·Filed 1997·Granted Aug 3, 1999·5 cites·10 claims
- 3627US8134382B2Semiconductor wafer having scribe line test modules including matching portions from subcircuits on active dieCHATTERJEE TATHAGATA·Filed 2010·Granted Mar 13, 2012·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →