Inventor · disambiguated record
Tamer Mohamed Tawfik Ahmed Mohamed Elazhary
Also filed as: ELAZHARY TAMER · ELAZHARY TAMER MOHAMED TAWFIK AHMED · ELAZHARY TAMER MOHAMED TAWFIK AHMED MOHAMED
15 granted patents·6 pending applications·9 citations·filing 2018–2024
86Inventor score
Top patents by PatentIndex Score
21 records- 0187US11175593B2Alignment sensor apparatus for process sensitivity compensationASML NETHERLANDS BV·Filed 2019·Granted Nov 16, 2021·4 cites·38 claims
- 0282US11994808B2Lithographic apparatus, metrology systems, phased array illumination sources and methods thereofASML HOLDING NV·Filed 2020·Granted May 28, 2024·1 cites·24 claims
- 0380US12066762B2On chip sensor for wafer overlay measurementASML HOLDING NV·Filed 2020·Granted Aug 20, 2024·1 cites·20 claims
- 0479US11604351B1Field bias optical element for digital projectorMETA PLATFORMS TECH LLC·Filed 2020·Granted Mar 14, 2023·1 cites·19 claims
- 0579US11526091B2Sensor apparatus and method for lithographic measurementsASML HOLDING NV·Filed 2020·Granted Dec 13, 2022·1 cites·20 claims
- 0678US12474577B2Waveguide disparity sensingMETA PLATFORMS TECH LLC·Filed 2024·Granted Nov 18, 2025·0 cites·20 claims
- 0776US2024361703A1On chip sensor for wafer overlay measurementASML HOLDING NV·Filed 2024·Application pending·0 cites
- 0875US11531280B2Compact alignment sensor arrangementsASML HOLDING NV·Filed 2019·Granted Dec 20, 2022·1 cites·18 claims
- 0971US12013531B1Active disparity sensing of head mounted displayMETA PLATFORMS TECH LLC·Filed 2022·Granted Jun 18, 2024·0 cites·20 claims
- 1061US12140872B2Optical designs of miniaturized overlay measurement systemASML HOLDING NV·Filed 2021·Granted Nov 12, 2024·0 cites·15 claims
- 1159US11789368B2Lithographic apparatus, metrology system, and illumination systems with structured illuminationASML HOLDING NV·Filed 2020·Granted Oct 17, 2023·0 cites·20 claims
- 1256US12487081B2On chip wafer alignment sensorASML HOLDING NV·Filed 2020·Granted Dec 2, 2025·0 cites·15 claims
- 1356US2024386678A1Techniques for binocular disparity measurement and correction using selected times and positions for presenting realignment patterns at a head-wearable deviceMETA PLATFORMS TECH LLC·Filed 2024·Application pending·0 cites
- 1455US12135909B1Synchronization of disparity cameraMETA PLATFORMS TECH INC·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 1555US11675192B2Hybrid coupling diffractive optical elementMETA PLATFORMS TECH LLC·Filed 2020·Granted Jun 13, 2023·0 cites·21 claims
- 1655US2025093656A1Disparity sensor for closed-loop active dimming control, and systems and methods of use thereofMETA PLATFORMS TECH LLC·Filed 2024·Application pending·0 cites
- 1751US11525662B2Electromechanical displacement sensorMETA PLATFORMS TECH LLC·Filed 2020·Granted Dec 13, 2022·0 cites·20 claims
- 1851US11181835B2Metrology sensor, lithographic apparatus and method for manufacturing devicesASML NETHERLANDS BV·Filed 2018·Granted Nov 23, 2021·0 cites·16 claims
- 1951US2022283515A1Metrology system and methodASML HOLDING NV·Filed 2020·Application pending·0 cites
- 2048US2023024433A1Optical components having athermalization and aberration correction characteristicsMETA PLATFORMS TECH LLC·Filed 2021·Application pending·0 cites
- 2145US2022100109A1Apparatus for and method of simultaneously acquiring parallel alignment marksASML HOLDING NV·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →