Inventor · disambiguated record
Taiji Ema
Also filed as: EMA TAIJI · HAYASHI LEGAL REPRESENTATIVE T · OHKAWA NARUMI
171 granted patents·12 pending applications·2,383 citations·filing 1986–2019
99Inventor score
Files withFUJITSU LTD108FUJITSU SEMICONDUCTOR LTD32FUJITSU MICROELECTRONICS LTD9EMA TAIJI8MIE FUJITSU SEMICONDUCTOR LTD6
Top patents by PatentIndex Score
183 records- 0198US7605041B2Semiconductor device and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Oct 20, 2009·122 cites·6 claims
- 0298US7323754B2Semiconductor device and its manufacture methodFUJITSU LTD·Filed 2005·Granted Jan 29, 2008·128 cites·6 claims
- 0395US8377783B2Method for reducing punch-through in a transistor deviceSUVOLTA INC·Filed 2010·Granted Feb 19, 2013·22 cites·6 claims
- 0494US5874756ASemiconductor storage device and method for fabricating the sameFUJITSU LTD·Filed 1996·Granted Feb 23, 1999·111 cites·68 claims
- 0593US8294217B2Semiconductor device and method of manufacturing semiconductor deviceEMA TAIJI·Filed 2011·Granted Oct 23, 2012·15 cites·15 claims
- 0692US7939893B2Semiconductor device and its manufacturing methodFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted May 10, 2011·11 cites·5 claims
- 0792US7414292B2Semiconductor device and its manufacturing methodFUJITSU LTD·Filed 2005·Granted Aug 19, 2008·27 cites·5 claims
- 0892US5521859ASemiconductor memory device having thin film transistor and method of producing the sameFUJITSU LTD·Filed 1995·Granted May 28, 1996·93 cites·27 claims
- 0991US7888740B2Semiconductor device and method of manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Feb 15, 2011·13 cites·8 claims
- 1090US5071783AMethod of producing a dynamic random access memory deviceFUJITSU LTD·Filed 1989·Granted Dec 10, 1991·64 cites·27 claims
- 1189US8158483B2Semiconductor device and its manufacturing methodEMA TAIJI·Filed 2011·Granted Apr 17, 2012·9 cites·8 claims
- 1288US8742547B2Semiconductor wafer and its manufacture method, and semiconductor chipYOSHIZAWA KAZUTAKA·Filed 2011·Granted Jun 3, 2014·9 cites·8 claims
- 1388US5539224ASemiconductor device having unit circuit-blocks in a common chip as a first layer with electrical interconnections therebetween provided exclusively in a second, upper, interconnection layer formed on the first layerFUJITSU LTD·Filed 1994·Granted Jul 23, 1996·63 cites·14 claims
- 1486US6529397B2Memory-logic semiconductor deviceFUJITSU LTD·Filed 2000·Granted Mar 4, 2003·44 cites·13 claims
- 1585US4974040ADynamic random access memory device and method of producing sameFUJITSU LTD·Filed 1990·Granted Nov 27, 1990·54 cites·23 claims
- 1684US7795100B2Semiconductor device and its manufacturing methodFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Sep 14, 2010·9 cites·17 claims
- 1784US7521765B2Semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Apr 21, 2009·22 cites·7 claims
- 1884US7445989B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2005·Granted Nov 4, 2008·11 cites·14 claims
- 1983US9818701B2Semiconductor device, semiconductor wafer and manufacturing method of semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Nov 14, 2017·4 cites·6 claims
- 2082US10818594B2Semiconductor deviceUNITED SEMICONDUCTOR JAPAN CO LTD·Filed 2019·Granted Oct 27, 2020·2 cites·21 claims
- 2182US5789788ASemiconductor device with first and second wells which have opposite conductivity types and a third well region formed on one of the first and second wellsFUJITSU LTD·Filed 1996·Granted Aug 4, 1998·53 cites·26 claims
- 2282US4953126ADynamic random access memory device including a stack capacitorFUJITSU LTD·Filed 1989·Granted Aug 28, 1990·31 cites·18 claims
- 2381US7755928B2Semiconductor memory device and semiconductor device groupFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Jul 13, 2010·14 cites·6 claims
- 2480US6026010ASemiconductor memory device with bit line contact areas and storage capacitor contact areasFUJITSU LTD·Filed 1998·Granted Feb 15, 2000·35 cites·3 claims
- 2579US8912069B2Semiconductor device with STI and method for manufacturing the semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Dec 16, 2014·3 cites·6 claims
- 2679US8698253B2Semiconductor device with STI and method for manufacturing the semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Apr 15, 2014·3 cites·7 claims
- 2779US7361552B2Semiconductor integrated circuit including a DRAM and an analog circuitFUJITSU LTD·Filed 2006·Granted Apr 22, 2008·6 cites·2 claims
- 2879US5572053ADynamic random access memory cell having a stacked capacitorFUJITSU LTD·Filed 1994·Granted Nov 5, 1996·30 cites·10 claims
- 2978US9685416B2Semiconductor wafer and its manufacture method, and semiconductor chipFUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jun 20, 2017·3 cites·22 claims
- 3078US8404554B2Method of manufacturing semiconductor deviceEMA TAIJI·Filed 2010·Granted Mar 26, 2013·3 cites·64 claims
- 3178US7820509B2Semiconductor device and method of manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Oct 26, 2010·5 cites·4 claims
- 3278US7671384B2Semiconductor integrated circuit device having improved punch-through resistance and production method thereof, semiconductor integrated circuit device including a low-voltage transistor and a high-voltage transistorFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Mar 2, 2010·7 cites·24 claims
- 3378US6744091B1Semiconductor storage device with self-aligned opening and method for fabricating the sameFUJITSU LTD·Filed 2000·Granted Jun 1, 2004·17 cites·16 claims
- 3478US5128273AMethod of making a dynamic random access memory cell with stacked capacitorFUJITSU LTD·Filed 1990·Granted Jul 7, 1992·30 cites·7 claims
- 3578US4737471AMethod for fabricating an insulated-gate FET having a narrow channel widthFUJITSU LTD·Filed 1986·Granted Apr 12, 1988·41 cites·14 claims
- 3677US10741699B2Semiconductor deviceUNITED SEMICONDUCTOR JAPAN CO LTD·Filed 2019·Granted Aug 11, 2020·2 cites·14 claims
- 3777US8704311B2Semiconductor device having epitaxial semiconductor layer above impurity layerFUJITA KAZUSHI·Filed 2012·Granted Apr 22, 2014·4 cites·15 claims
- 3877US5021357AMethod of making a dram cell with stacked capacitorFUJITSU LTD·Filed 1990·Granted Jun 4, 1991·36 cites·12 claims
- 3976US9087891B2Semiconductor device, semiconductor wafer and manufacturing method of semiconductor deviceYOSHIZAWA KAZUTAKA·Filed 2012·Granted Jul 21, 2015·4 cites·15 claims
- 4076US8778786B1Method for substrate preservation during transistor fabricationSCUDDER LANCE·Filed 2012·Granted Jul 15, 2014·4 cites·19 claims
- 4176US6297541B1Semiconductor device and method for fabricating the sameFUJITSU LTD·Filed 1999·Granted Oct 2, 2001·42 cites·20 claims
- 4276US4977102AMethod of producing layer structure of a memory cell for a dynamic random access memory deviceFUJITSU LTD·Filed 1989·Granted Dec 11, 1990·27 cites·7 claims
- 4376US4905064ASemiconductor memory device having stacked-capacitor type memory cellsFUJITSU LTD·Filed 1988·Granted Feb 27, 1990·36 cites·8 claims
- 4475US6791187B2Semiconductor storage device and method for fabricating the sameFUJITSU LTD·Filed 2002·Granted Sep 14, 2004·14 cites·24 claims
- 4574US8907430B2Semiconductor device and manufacturing method of semiconductor deviceUSUJIMA AKIHIRO·Filed 2009·Granted Dec 9, 2014·6 cites·3 claims
- 4673US10014363B2Semiconductor device having resistance elements and fabrication method thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Jul 3, 2018·1 cites·9 claims
- 4773US8426267B2Semiconductor device and method of manufacturing the sameTSUTSUMI TOMOHIKO·Filed 2011·Granted Apr 23, 2013·2 cites·3 claims
- 4873US8080852B2Semiconductor device and method of manufacturing the sameTSUTSUMI TOMOHIKO·Filed 2010·Granted Dec 20, 2011·2 cites·5 claims
- 4973US7508692B2Semiconductor memory device and semiconductor device groupFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Mar 24, 2009·6 cites·6 claims
- 5073US4910566ALayer structure of a memory cell for a dynamic random access memory device and method for producing the sameFUJITSU LTD·Filed 1988·Granted Mar 20, 1990·24 cites·12 claims
Showing the top 50 of 183 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →