Inventor · disambiguated record
Takaki Hashimoto
Also filed as: HASHIMOTO TAKAKI
13 granted patents·11 pending applications·18 citations·filing 2009–2024
86Inventor score
Top patents by PatentIndex Score
24 records- 0180US8293456B2Semiconductor device manufacturing methodFUKUHARA KAZUYA·Filed 2009·Granted Oct 23, 2012·5 cites·7 claims
- 0278US10151972B2Manufacturing method of photomask and recording mediumTOSHIBA MEMORY CORP·Filed 2017·Granted Dec 11, 2018·2 cites·10 claims
- 0375US8865589B2Semiconductor device and manufacturing method of semiconductor deviceHASHIMOTO TAKAKI·Filed 2012·Granted Oct 21, 2014·4 cites·7 claims
- 0470US8288812B2Semiconductor device and method of manufacturing the sameKAI YASUNOBU·Filed 2010·Granted Oct 16, 2012·3 cites·15 claims
- 0568US10295409B2Substrate measurement system, method of measuring substrate, and computer program productTOSHIBA MEMORY CORP·Filed 2016·Granted May 21, 2019·1 cites·15 claims
- 0668US8778570B2Photomask and method for manufacturing the sameOKUDA KENTARO·Filed 2012·Granted Jul 15, 2014·2 cites·11 claims
- 0762US2024210334A1Measurement device, measurement system, and measurement methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0861US2023324317A1Inspection device and inspection methodKIOXIA CORP·Filed 2022·Application pending·0 cites
- 0959US9257367B2Integrated circuit device, method for producing mask layout, and program for producing mask layoutTOSHIBA KK·Filed 2013·Granted Feb 9, 2016·1 cites·9 claims
- 1059US2025085102A1Measurement device and measurement methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 1158US12411007B2Measurement device and measurement methodKIOXIA CORP·Filed 2022·Granted Sep 9, 2025·0 cites·19 claims
- 1254US2024290666A1Method for manufacturing semiconductor device, film thickness measurement method, and temperature measurement methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 1353US2015008584A1Semiconductor device and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1452US8679731B2Semiconductor device manufacturing methodFUKUHARA KAZUYA·Filed 2012·Granted Mar 25, 2014·0 cites·8 claims
- 1551US2024264009A1Semiconductor manufacturing apparatus and semiconductor device manufacturing methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 1645US10120275B2Layout method of mask pattern, manufacturing method of a semiconductor device and exposure maskTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 6, 2018·0 cites·14 claims
- 1745US2021270750A1Measurement apparatus and methodKIOXIA CORP·Filed 2020·Application pending·0 cites
- 1843US2015070681A1Pattern generating method, pattern forming method, and pattern generating programTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1942US9698157B2Microstructure device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Jul 4, 2017·0 cites·20 claims
- 2041US9703912B2Mask set, fabrication method of mask set, manufacturing method of semiconductor device, and recording mediumTOSHIBA KK·Filed 2015·Granted Jul 11, 2017·0 cites·20 claims
- 2135US2013045607A1Pattern generating apparatus, pattern generating program, and method for fabricating semiconductor deviceINOUE AI·Filed 2012·Application pending·0 cites
- 2233US2012070985A1Exposure method and method for manufacturing semiconductor deviceHASHIMOTO TAKAKI·Filed 2011·Application pending·0 cites
- 2331US2010202181A1Semiconductor memory deviceHASHIMOTO TAKAKI·Filed 2009·Application pending·0 cites
- 2429US9910363B2Measurement apparatus, exposure apparatus, measurement method, and recording mediumTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 6, 2018·0 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when Takaki Hashimoto files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →