Inventor · disambiguated record
Tatsuaki Ishijima
Also filed as: ISHIJIMA TATSUAKI
8 granted patents·104 citations·filing 2002–2010
86Inventor score
Top patents by PatentIndex Score
8 records- 0196US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0295US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 0393US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 0490US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 0583US7745782B2Electrostatic charge measurement method, focus adjustment method, and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 29, 2010·7 cites·10 claims
- 0650US8835844B2Sample electrification measurement method and charged particle beam apparatusEZUMI MAKOTO·Filed 2010·Granted Sep 16, 2014·0 cites·12 claims
- 0746US8178836B2Electrostatic charge measurement method, focus adjustment method, and scanning electron microscopeISHIJIMA TATSUAKI·Filed 2010·Granted May 15, 2012·0 cites·14 claims
- 0832US9129775B2Specimen potential measuring method, and charged particle beam deviceISHIJIMA TATSUAKI·Filed 2010·Granted Sep 8, 2015·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →