Inventor · disambiguated record
Tal Marciano
Also filed as: MARCIANO TAL
14 granted patents·3 pending applications·24 citations·filing 2015–2025
87Inventor score
Top patents by PatentIndex Score
17 records- 0189US9903711B2Feed forward of metrology data in a metrology systemKLA TENCOR CORP·Filed 2016·Granted Feb 27, 2018·5 cites·33 claims
- 0288US10203200B2Analyzing root causes of process variation in scatterometry metrologyKLA TENCOR CORP·Filed 2016·Granted Feb 12, 2019·7 cites·23 claims
- 0381US10831108B2Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrologyKLA CORP·Filed 2016·Granted Nov 10, 2020·5 cites·77 claims
- 0478US11333982B2Scaling metric for quantifying metrology sensitivity to process variationKLA CORP·Filed 2020·Granted May 17, 2022·2 cites·27 claims
- 0575US11249400B2Per-site residuals analysis for accurate metrology measurementsKLA CORP·Filed 2019·Granted Feb 15, 2022·1 cites·20 claims
- 0673US10415963B2Estimating and eliminating inter-cell process variation inaccuracyKLA TENCOR CORP·Filed 2015·Granted Sep 17, 2019·2 cites·21 claims
- 0770US10317198B2Three-dimensional mapping of a waferKLA TENCOR CORP·Filed 2016·Granted Jun 11, 2019·2 cites·19 claims
- 0866US2025285276A1Methods and apparatuses for determining transducer locations to generate tumor treating fieldsNOVOCURE GMBH·Filed 2025·Application pending·0 cites
- 0960US11237120B2Expediting spectral measurement in semiconductor device fabricationKLA TENCOR CORP·Filed 2020·Granted Feb 1, 2022·0 cites·14 claims
- 1056US12333713B2Methods and apparatuses for determining transducer locations to generate tumor treating fieldsNOVOCURE GMBH·Filed 2021·Granted Jun 17, 2025·0 cites·19 claims
- 1152US10866090B2Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrologyKLA TENCOR CORP·Filed 2018·Granted Dec 15, 2020·0 cites·14 claims
- 1247US12409332B2Methods and apparatuses for delivering tumor treating fields to a subject's body for near-surface tumorsNOVOCURE GMBH·Filed 2022·Granted Sep 9, 2025·0 cites·18 claims
- 1347US10761034B2Expediting spectral measurement in semiconductor device fabricationKLA TENCOR CORP·Filed 2017·Granted Sep 1, 2020·0 cites·8 claims
- 1444US2023066875A1Transducer apparatuses with electrode array shaped to reduce edge effect in delivering tumor treating fields to a subject's bodyNOVOCURE GMBH·Filed 2022·Application pending·0 cites
- 1542US2022305276A1Transducer apparatuses for delivering tumor treating fields to a subject's bodyNOVOCURE GMBH·Filed 2022·Application pending·0 cites
- 1641US11725934B2Systems and methods for metrology optimization based on metrology landscapesKLA CORP·Filed 2020·Granted Aug 15, 2023·0 cites·15 claims
- 1739US10379449B2Identifying process variations during product manufactureKLA TENCOR CORP·Filed 2018·Granted Aug 13, 2019·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →