Inventor · disambiguated record
Takafumi Noda
Also filed as: NODA TAKAFUMI
53 granted patents·19 pending applications·259 citations·filing 2000–2024
98Inventor score
Top patents by PatentIndex Score
72 records- 0196US7812385B2Ferroelectric capacitor device and method with optimum hysteresis characteristicsSEIKO EPSON CORP·Filed 2008·Granted Oct 12, 2010·51 cites·9 claims
- 0285US7825027B2Method for manufacturing memory deviceSEIKO EPSON CORP·Filed 2008·Granted Nov 2, 2010·12 cites·7 claims
- 0385US2024380174A1Light Emitting Device And ProjectorSEIKO EPSON CORP·Filed 2024·Application pending·0 cites
- 0484US6713886B2Semiconductor deviceSEIKO EPSON CORP·Filed 2001·Granted Mar 30, 2004·29 cites·9 claims
- 0583US11394171B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2018·Granted Jul 19, 2022·1 cites·7 claims
- 0683US9274004B2Infrared sensor and heat sensing elementSEIKO EPSON CORP·Filed 2014·Granted Mar 1, 2016·5 cites·17 claims
- 0782US8581192B2Pyroelectric detector and method for manufacturing same, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2011·Granted Nov 12, 2013·4 cites·12 claims
- 0881US10608411B2Light-emitting device, method for manufacturing same, and projectorSEIKO EPSON CORP·Filed 2019·Granted Mar 31, 2020·2 cites·8 claims
- 0981US6657243B2Semiconductor device with SRAM section including a plurality of memory cellsSEIKO EPSON CORP·Filed 2001·Granted Dec 2, 2003·30 cites·27 claims
- 1080US8851748B2Thermal detector, thermal detector device, electronic instrument, and method of manufacturing thermal detectorNODA TAKAFUMI·Filed 2011·Granted Oct 7, 2014·4 cites·17 claims
- 1180US8258597B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2011·Granted Sep 4, 2012·4 cites·20 claims
- 1279US12080992B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2022·Granted Sep 3, 2024·0 cites·13 claims
- 1377US8563933B2Thermal detector, thermal detector device, electronic instrument, and method of manufacturing thermal detectorNODA TAKAFUMI·Filed 2011·Granted Oct 22, 2013·4 cites·18 claims
- 1477US7989862B2Semiconductor device and its manufacturing methodSEIKO EPSON CORP·Filed 2008·Granted Aug 2, 2011·7 cites·11 claims
- 1576US6469356B2Semiconductor memory device having different distances between gate electrode layersSEIKO EPSON CORP·Filed 2001·Granted Oct 22, 2002·22 cites·10 claims
- 1675US9140610B2Pyroelectric detector and method for manufacturing same, pyroelectric detection device, and electronic instrumentSEIKO EPSON CORP·Filed 2014·Granted Sep 22, 2015·2 cites·20 claims
- 1774US8362584B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentSEIKO EPSON CORP·Filed 2011·Granted Jan 29, 2013·3 cites·19 claims
- 1869US8610064B2Thermal detector, thermal detector device, and electronic instrumentNODA TAKAFUMI·Filed 2011·Granted Dec 17, 2013·2 cites·20 claims
- 1968US8736010B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2011·Granted May 27, 2014·2 cites·20 claims
- 2068US8710443B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2012·Granted Apr 29, 2014·2 cites·20 claims
- 2167US12199402B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2021·Granted Jan 14, 2025·0 cites·11 claims
- 2267US11973318B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2021·Granted Apr 30, 2024·0 cites·7 claims
- 2367US9163993B2Thermal detector, thermal detection device, and electronic instrumentNODA TAKAFUMI·Filed 2012·Granted Oct 20, 2015·2 cites·20 claims
- 2467US8502150B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2012·Granted Aug 6, 2013·2 cites·20 claims
- 2566US11947249B2Light emitting apparatus, method for manufacturing light emitting apparatus, and projectorSEIKO EPSON CORP·Filed 2021·Granted Apr 2, 2024·0 cites·13 claims
- 2666US8592937B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2012·Granted Nov 26, 2013·2 cites·20 claims
- 2766US8362583B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentSEIKO EPSON CORP·Filed 2011·Granted Jan 29, 2013·2 cites·20 claims
- 2866US8039884B2Semiconductor device having a contact hole with a curved cross-section and its manufacturing methodSEIKO EPSON CORP·Filed 2008·Granted Oct 18, 2011·3 cites·13 claims
- 2963US6620637B2Semiconductor analysis apparatus, semiconductor analysis method and method for manufacturing semiconductor deviceSEIKO EPSON CORP·Filed 2002·Granted Sep 16, 2003·4 cites·1 claims
- 3062US9182287B2Infrared sensor, heat sensing element, and heat sensing method using the sameSEIKO EPSON CORP·Filed 2014·Granted Nov 10, 2015·1 cites·7 claims
- 3161US8569698B2Thermal detector, thermal detection device, and electronic instrumentTAKIZAWA JUN·Filed 2011·Granted Oct 29, 2013·2 cites·20 claims
- 3257US12125947B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2021·Granted Oct 22, 2024·0 cites·9 claims
- 3357US7507622B2Semiconductor device and manufacturing method thereofSEIKO EPSON CORP·Filed 2005·Granted Mar 24, 2009·1 cites·7 claims
- 3457US7141862B2Semiconductor device and method for manufacturing the sameSEIKO EPSON CORP·Filed 2004·Granted Nov 28, 2006·6 cites·5 claims
- 3556US6469400B2Semiconductor memory deviceSEIKO EPSON CORP·Filed 2001·Granted Oct 22, 2002·7 cites·8 claims
- 3656US6407463B2Semiconductor memory device having gate electrode, drain-drain contact, and drain-gate contact layersSEIKO EPSON CORP·Filed 2000·Granted Jun 18, 2002·6 cites·20 claims
- 3755US8907285B2Pyroelectric detector and method for manufacturing same, pyroelectric detection device, and electronic instrumentSEIKO EPSON CORP·Filed 2013·Granted Dec 9, 2014·0 cites·11 claims
- 3855US2014369382A1Thermal type photodetector, thermal type photodetector device, electronic instrument, and method of manufacturing thermal type photodetecgtorSEIKO EPSON CORP·Filed 2014·Application pending·0 cites
- 3954US11380820B2Light emitting device and projectorSEIKO EPSON CORP·Filed 2020·Granted Jul 5, 2022·0 cites·5 claims
- 4054US7008850B2Method for manufacturing a semiconductor deviceSEIKO EPSON CORP·Filed 2004·Granted Mar 7, 2006·6 cites·11 claims
- 4153US6538338B2Static RAM semiconductor memory device having reduced memorySEIKO EPSON CORP·Filed 2001·Granted Mar 25, 2003·5 cites·7 claims
- 4253US2015088000A1Method for manufacturing optical device, optical device, and biological information detectorSEIKO EPSON CORP·Filed 2014·Application pending·0 cites
- 4352US8916948B2Pyroelectric detector, pyroelectric detection device, and electronic instrumentNODA TAKAFUMI·Filed 2012·Granted Dec 23, 2014·0 cites·20 claims
- 4451US6507124B2Semiconductor memory deviceSEIKO EPSON CORP·Filed 2001·Granted Jan 14, 2003·10 cites·8 claims
- 4551US2008090308A1Semiconductor device alignment mark having a plane pattern and semiconductor deviceNODA TAKAFUMI·Filed 2007·Application pending·0 cites
- 4651US2007257288A1Alignment mark for semiconductor device, and semiconductor deviceSEIKO EPSON CORP·Filed 2007·Application pending·0 cites
- 4750US8916824B2Pyroelectric light detector, pyroelectric light detecting device, and electronic deviceSEIKO EPSON CORP·Filed 2012·Granted Dec 23, 2014·0 cites·21 claims
- 4849US10923624B2Imaging apparatus and endoscopeSEIKO EPSON CORP·Filed 2018·Granted Feb 16, 2021·0 cites·18 claims
- 4949US9006856B2Thermal electromagnetic wave detection element, method for producing thermal electromagnetic wave detection element, thermal electromagnetic wave detection device, and electronic apparatusSEIKO EPSON CORP·Filed 2013·Granted Apr 14, 2015·0 cites·20 claims
- 5049US2006220265A1Alignment mark for semiconductor device, and semiconductor deviceSEIKO EPSON CORP·Filed 2006·Application pending·0 cites
Showing the top 50 of 72 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Takafumi Noda files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →