Inventor · disambiguated record
Taku Ogura
Also filed as: OGURA TAKU
46 granted patents·10 pending applications·650 citations·filing 1998–2021
98Inventor score
Top patents by PatentIndex Score
56 records- 0198US7466592B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2007·Granted Dec 16, 2008·89 cites·3 claims
- 0296US7164601B2Multi-level nonvolatile semiconductor memory device utilizing a nonvolatile semiconductor memory device for storing binary dataRENESAS TECH CORP·Filed 2004·Granted Jan 16, 2007·77 cites·13 claims
- 0394US5991197ASemiconductor memory device having data protection featureMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 23, 1999·124 cites·9 claims
- 0490US7230852B2Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of timeRENESAS TECH CORP·Filed 2004·Granted Jun 12, 2007·42 cites·9 claims
- 0585US10113752B2Ceiling-embedded air conditioner with a blowoff structure blowing air to all directionsFUJITSU GENERAL LTD·Filed 2016·Granted Oct 30, 2018·4 cites·3 claims
- 0682US8492826B2Non-volatile semiconductor memory device and manufacturing method thereofAJIKA NATSUO·Filed 2010·Granted Jul 23, 2013·6 cites·7 claims
- 0780US7542363B2Semiconductor memory device enhancing reliability in data readingRENESAS TECH CORP·Filed 2005·Granted Jun 2, 2009·11 cites·6 claims
- 0879US6147547ACharge pump circuit capable of generating positive and negative voltages and nonvolatile semiconductor memory device comprising the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 14, 2000·39 cites·17 claims
- 0978US8337710B2Ozone oxidation accelerator, ozone oxidation accelerator composition, and ozone treatment methodTAKEUCHI YOSHIKUNI·Filed 2011·Granted Dec 25, 2012·5 cites·3 claims
- 1078US6429724B1Semiconductor device capable of generating a plurality of voltagesMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Aug 6, 2002·23 cites·5 claims
- 1177US7969780B2Nonvolatile semiconductor memory using an adjustable threshold voltage transistor in a flip-flopGENUSION INC·Filed 2007·Granted Jun 28, 2011·9 cites·22 claims
- 1274US11485325B2Vehicle wiper deviceDENSO CORP·Filed 2021·Granted Nov 1, 2022·0 cites·6 claims
- 1374US6480057B2Charge pump circuit allowing efficient electric charge transferMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Nov 12, 2002·46 cites·9 claims
- 1473US7885132B2Semiconductor memory device enhancing reliability in data readingRENESAS ELECTRONICS CORP·Filed 2009·Granted Feb 8, 2011·7 cites·2 claims
- 1573US7268612B2Semiconductor device with pump circuitRENESAS TECH CORP·Filed 2007·Granted Sep 11, 2007·5 cites·2 claims
- 1673US7164602B2Nonvolatile semiconductor memory device including high efficiency and low cost redundant structureRENESAS TECH CORP·Filed 2004·Granted Jan 16, 2007·20 cites·15 claims
- 1772US8964463B2Read disturb control in a nonvolatile semiconductor memory device having P-type memory cell transistorGENUSION INC·Filed 2013·Granted Feb 24, 2015·4 cites·6 claims
- 1872US6349060B1Non-volatile semiconductor memory device having a stable read marginMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 19, 2002·19 cites·8 claims
- 1971US8106443B2Non-volatile semiconductor memory deviceAJIKA NATSUO·Filed 2008·Granted Jan 31, 2012·3 cites·8 claims
- 2071US7149115B2Nonvolatile memory device including circuit formed of thin film transistorsRENESAS TECH CORP·Filed 2004·Granted Dec 12, 2006·11 cites·4 claims
- 2170US8339862B2Nonvolatile semiconductor memory deviceAIIKA NATSUO·Filed 2008·Granted Dec 25, 2012·11 cites·20 claims
- 2268US7365578B2Semiconductor device with pump circuitRENESAS TECH CORP·Filed 2007·Granted Apr 29, 2008·5 cites·2 claims
- 2367US6414862B1Boosting circuit having a detecting portion for detecting the value of a power supply voltageMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 2, 2002·20 cites·18 claims
- 2465US8000137B2Nonvolatile semiconductor memory device and usage method thereofGENUSION INC·Filed 2009·Granted Aug 16, 2011·5 cites·20 claims
- 2559US7436712B2Nonvolatile memory device including circuit formed of thin film transistorsRENESAS TECH CORP·Filed 2007·Granted Oct 14, 2008·2 cites·4 claims
- 2658US6229740B1Voltage generation circuit having boost function and capable of preventing output voltage from exceeding prescribed value, and semiconductor memory device provided therewithMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 8, 2001·17 cites·11 claims
- 2756US5943266ASemiconductor integrated circuit device employing a programming circuit having increased immunity to gate disturbance and method of programming thereforMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 24, 1999·16 cites·21 claims
- 2855US8897077B2Nonvolatile semiconductor memory deviceGENUSION INC·Filed 2012·Granted Nov 25, 2014·1 cites·14 claims
- 2955US6181629B1Semiconductor memory device incorporating potential generation circuit with rapid rise of output potentialMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jan 30, 2001·15 cites·8 claims
- 3053US10881024B2Electronic device having a hermetically sealed housing with internal projectionMURATA MANUFACTURING CO·Filed 2018·Granted Dec 29, 2020·0 cites·15 claims
- 3153US7180362B2Semiconductor device with pump circuitRENESAS TECH CORP·Filed 2004·Granted Feb 20, 2007·4 cites·2 claims
- 3252US7821829B2Nonvolatile memory device including circuit formed of thin film transistorsRENESAS TECH CORP·Filed 2009·Granted Oct 26, 2010·1 cites·2 claims
- 3349US8809247B2Cleaning composition and method for cleaning substrate for electronic deviceHIDAKA MAKOTO·Filed 2009·Granted Aug 19, 2014·0 cites·21 claims
- 3449US8107300B2Non-volatile semiconductor memory device comprising capacitive coupling program inhibit circuitryOGURA TAKU·Filed 2008·Granted Jan 31, 2012·2 cites·12 claims
- 3549US2010147777A1Ozone Oxidation Accelerator, Ozone Oxidation Accelerator Composition, and Ozone Treatment MethodLION CORP·Filed 2006·Application pending·0 cites
- 3648US10041696B2Ceiling-embedded air conditionerFUJITSU GENERAL LTD·Filed 2016·Granted Aug 7, 2018·0 cites·4 claims
- 3748US10030876B2Ceiling-embedded air conditionerFUJITSU GENERAL LTD·Filed 2016·Granted Jul 24, 2018·0 cites·5 claims
- 3847US6760259B1Non-volatile semiconductor memory device that can be fabricated with erasure unit modifiedRENESAS TECH CORP·Filed 2003·Granted Jul 6, 2004·5 cites·20 claims
- 3947US2012112265A1Non-volatile semiconductor memory deviceAJIKA NATSUO·Filed 2012·Application pending·0 cites
- 4046US8000143B2Nonvolatile memory device including circuit formed of thin film transistorsRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 16, 2011·0 cites·2 claims
- 4145US8446765B2Semiconductor memory device having memory block configurationOGURA TAKU·Filed 2012·Granted May 21, 2013·0 cites·4 claims
- 4245US8000159B2Semiconductor memory device having memory block configurationRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 16, 2011·0 cites·4 claims
- 4345US7248513B2Semiconductor memory device having memory block configurationRENESAS TECH CORP·Filed 2004·Granted Jul 24, 2007·2 cites·7 claims
- 4445US2009021981A1Nonvolatile memory device including circuit formed of thin film transistorsRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 4544US8208303B2Semiconductor memory device having memory block configurationOGURA TAKU·Filed 2011·Granted Jun 26, 2012·0 cites·6 claims
- 4644US7782672B2Semiconductor memory device having memory block configurationRENESAS TECH CORP·Filed 2008·Granted Aug 24, 2010·0 cites·4 claims
- 4744US2009080252A1Semiconductor memory deviceRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 4843US7447087B2Semiconductor memory device having memory block configurationRENESAS TECH CORP·Filed 2007·Granted Nov 4, 2008·0 cites·4 claims
- 4942US7339831B2Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of timeRENESAS TECH CORP·Filed 2007·Granted Mar 4, 2008·0 cites·2 claims
- 5042US7307886B2Nonvolatile memory device including circuit formed of thin film transistorsRENESAS TECH CORP·Filed 2006·Granted Dec 11, 2007·0 cites·3 claims
Showing the top 50 of 56 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →