Inventor · disambiguated record
Tanmoy Roy
Also filed as: ROY TANMOY
29 granted patents·1 pending application·225 citations·filing 1998–2023
95Inventor score
Files withST MICROELECTRONICS INT NV20SUN MICROSYSTEMS INC5ST MICROELECTRONICS SRL2CALLEN OLIVIER1ROY TANMOY1
Top patents by PatentIndex Score
30 records- 0195US11094376B2In-memory compute array with integrated bias elementsST MICROELECTRONICS INT NV·Filed 2020·Granted Aug 17, 2021·6 cites·21 claims
- 0286US11742045B2Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memoryST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 29, 2023·2 cites·16 claims
- 0386US11474788B2Elements for in-memory computeST MICROELECTRONICS SRL·Filed 2020·Granted Oct 18, 2022·2 cites·17 claims
- 0485US10283191B1Method and circuit for adaptive read-write operation in self-timed memoryST MICROELECTRONICS INT NV·Filed 2018·Granted May 7, 2019·6 cites·15 claims
- 0584US6937971B1System and method for determining the desired decoupling components for a power distribution system having a voltage regulator moduleSUN MICROSYSTEMS INC·Filed 2000·Granted Aug 30, 2005·44 cites·34 claims
- 0684US6564355B1System and method for analyzing simultaneous switching noiseSUN MICROSYSTEMS INC·Filed 2000·Granted May 13, 2003·43 cites·55 claims
- 0783US11532633B2Dual port memory cell with improved access resistanceST MICROELECTRONICS INT NV·Filed 2021·Granted Dec 20, 2022·1 cites·20 claims
- 0881US11605424B2In-memory compute array with integrated bias elementsST MICROELECTRONICS INT NV·Filed 2021·Granted Mar 14, 2023·1 cites·20 claims
- 0981US6571184B2System and method for determining the decoupling capacitors for power distribution systems with a frequency-dependent target impedanceSUN MICROSYSTEMS INC·Filed 2001·Granted May 27, 2003·32 cites·31 claims
- 1079US6532439B2Method for determining the desired decoupling components for power distribution systemsSUN MICROSYSTEMS INC·Filed 1998·Granted Mar 11, 2003·61 cites·32 claims
- 1176US11889675B2Dual port memory cell with improved access resistanceST MICROELECTRONICS INT NV·Filed 2022·Granted Jan 30, 2024·0 cites·19 claims
- 1275US10998077B2Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memoryST MICROELECTRONICS INT NV·Filed 2019·Granted May 4, 2021·3 cites·21 claims
- 1373US11829730B2Elements for in-memory computeST MICROELECTRONICS SRL·Filed 2022·Granted Nov 28, 2023·0 cites·28 claims
- 1465US12243584B2In-memory compute array with integrated bias elementsST MICROELECTRONICS INT NV·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
- 1564US11776650B2Memory calibration device, system and methodST MICROELECTRONICS INT NV·Filed 2022·Granted Oct 3, 2023·0 cites·21 claims
- 1664US11749343B2Memory management device, system and methodST MICROELECTRONICS INT NV·Filed 2022·Granted Sep 5, 2023·0 cites·27 claims
- 1764US11152376B2Dual port memory cell with improved access resistanceST MICROELECTRONICS INT NV·Filed 2018·Granted Oct 19, 2021·1 cites·17 claims
- 1862US11257543B2Memory management device, system and methodST MICROELECTRONICS INT NV·Filed 2020·Granted Feb 22, 2022·0 cites·33 claims
- 1961US11798615B2High density array, in memory computingST MICROELECTRONICS INT NV·Filed 2022·Granted Oct 24, 2023·0 cites·20 claims
- 2057US11398289B2Memory calibration device, system and methodST MICROELECTRONICS INT NV·Filed 2021·Granted Jul 26, 2022·0 cites·18 claims
- 2156US11335397B2High-density array, in memory computingST MICROELECTRONICS INT NV·Filed 2020·Granted May 17, 2022·0 cites·19 claims
- 2256US8458545B2Method and apparatus for testing of a memory with redundancy elementsROY TANMOY·Filed 2010·Granted Jun 4, 2013·3 cites·31 claims
- 2349US10706915B2Method and circuit for adaptive read-write operation in self-timed memoryST MICROELECTRONICS INT NV·Filed 2019·Granted Jul 7, 2020·0 cites·21 claims
- 2445US10637447B2Low voltage, master-slave flip-flopST MICROELECTRONICS INT NV·Filed 2019·Granted Apr 28, 2020·0 cites·19 claims
- 2545US6195613B1Method and system for measuring equivalent series resistance of capacitors and method for decoupling power distribution systemsSUN MICROSYSTEMS INC·Filed 1998·Granted Feb 27, 2001·19 cites·20 claims
- 2644US7791970B2Biased sensing moduleST MICROELECTRONICS PVT LTD·Filed 2007·Granted Sep 7, 2010·1 cites·19 claims
- 2742US10277207B1Low voltage, master-slave flip-flopST MICROELECTRONICS INT NV·Filed 2018·Granted Apr 30, 2019·0 cites·16 claims
- 2840US9590602B2System and method for a pulse generatorST MICROELECTRONICS INT NV·Filed 2014·Granted Mar 7, 2017·0 cites·33 claims
- 2939US2013058155A1Sram dimensioned to provide beta ratio supporting read stability and reduced write timeCALLEN OLIVIER·Filed 2012·Application pending·0 cites
- 3036US11393532B2Circuit and method for at speed detection of a word line fault condition in a memory circuitST MICROELECTRONICS INT NV·Filed 2020·Granted Jul 19, 2022·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →