Inventor · disambiguated record
Takashi Sekino
Also filed as: SEKINO TAKASHI
30 granted patents·2 pending applications·300 citations·filing 1991–2009
97Inventor score
Top patents by PatentIndex Score
32 records- 0187US7876120B2Test apparatus, pin electronics card, electrical device and switchADVANTEST CORP·Filed 2008·Granted Jan 25, 2011·16 cites·10 claims
- 0287US7512872B2Test apparatus and test methodADVANTEST CORP·Filed 2006·Granted Mar 31, 2009·9 cites·7 claims
- 0387US6276772B1Ink jet printer using piezoelectric elements with improved ink droplet impinging accuracyHITACHI KOKI KK·Filed 1999·Granted Aug 21, 2001·62 cites·24 claims
- 0485US7707484B2Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted dataADVANTEST CORP·Filed 2009·Granted Apr 27, 2010·7 cites·4 claims
- 0584US7557561B2Electronic device, circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Jul 7, 2009·7 cites·18 claims
- 0683US7394238B2High frequency delay circuit and test apparatusADVANTEST CORP·Filed 2005·Granted Jul 1, 2008·9 cites·7 claims
- 0782US5225775AIc testing device for permitting adjustment of timing of a test signalADVANTEST CORP·Filed 1991·Granted Jul 6, 1993·50 cites·13 claims
- 0879US6294949B1Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatusADVANTEST CORP·Filed 2000·Granted Sep 25, 2001·23 cites·30 claims
- 0976US7589549B2Driver circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Sep 15, 2009·9 cites·9 claims
- 1076US7013230B2Input-output circuit and a testing apparatusADVANTEST CORP·Filed 2004·Granted Mar 14, 2006·18 cites·17 claims
- 1174US7692441B2Test apparatus and pin electronics cardADVANTEST CORP·Filed 2008·Granted Apr 6, 2010·4 cites·8 claims
- 1271US8115520B2Driver circuitMATSUMOTO NAOKI·Filed 2009·Granted Feb 14, 2012·3 cites·6 claims
- 1366US6678478B1Correcting method of optical signal transmission system and optical signal transmission system using said correcting methodADVANTEST CORP·Filed 2000·Granted Jan 13, 2004·9 cites·23 claims
- 1465US7755377B2Driver circuit and test apparatusADVANTEST CORP·Filed 2007·Granted Jul 13, 2010·5 cites·10 claims
- 1564US7453932B2Test device and setting methodADVANTEST CORP·Filed 2005·Granted Nov 18, 2008·4 cites·8 claims
- 1664US6749279B2Inkjet recording device capable of controlling ejection timing of each nozzle individuallyHITACHI PRINTING SOLUTIONS LTD·Filed 2002·Granted Jun 15, 2004·9 cites·17 claims
- 1762US7679390B2Test apparatus and pin electronics cardADVANTEST CORP·Filed 2008·Granted Mar 16, 2010·3 cites·14 claims
- 1861US7990177B2Driver circuit for producing signal simulating transmission lossADVANTEST CORP·Filed 2009·Granted Aug 2, 2011·3 cites·7 claims
- 1961US7808291B2Jitter generating circuitADVANTEST CORP·Filed 2006·Granted Oct 5, 2010·3 cites·14 claims
- 2061US7800912B2Signal transfer system, signal output circuit board, signal receiving circuit board, signal output method, and signal receiving methodADVANTEST CORP·Filed 2006·Granted Sep 21, 2010·3 cites·8 claims
- 2159US7528637B2Driver circuitADVANTEST CORP·Filed 2006·Granted May 5, 2009·3 cites·9 claims
- 2257US7342407B2Temperature compensation circuit and testing apparatusADVANTEST CORP·Filed 2006·Granted Mar 11, 2008·3 cites·7 claims
- 2355US7123025B2Differential comparator circuit, test head, and test apparatusADVANTEST CORP·Filed 2005·Granted Oct 17, 2006·2 cites·7 claims
- 2451US7459897B2Terminator circuit, test apparatus, test head, and communication deviceADVANTEST CORP·Filed 2007·Granted Dec 2, 2008·1 cites·16 claims
- 2550US5821529AMeasuring board having an optically driven switch and I/O terminal testing system using the sameADVANTEST CORP·Filed 1997·Granted Oct 13, 1998·15 cites·10 claims
- 2649US6462598B1Delay time control circuitADVANTEST CORP·Filed 1996·Granted Oct 8, 2002·10 cites·10 claims
- 2748US5869992ADelay time control circuitADVANTEST CORP·Filed 1996·Granted Feb 9, 1999·10 cites·13 claims
- 2847US7962110B2Driver circuit and test apparatusADVANTEST CORP·Filed 2008·Granted Jun 14, 2011·0 cites·10 claims
- 2946US7902835B2Transmission line driving circuitADVANTEST CORP·Filed 2006·Granted Mar 8, 2011·0 cites·5 claims
- 3046US2009051347A1High frequency delay circuit and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 3145US2008143318A1High frequency delay circuit and test apparatusADVANTEST CORP·Filed 2007·Application pending·0 cites
- 3240US7538582B2Driver circuit, test apparatus and adjusting methodADVANTEST CORP·Filed 2005·Granted May 26, 2009·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →