Inventor · disambiguated record
Takehiro Tachizaki
Also filed as: TACHIZAKI TAKEHIRO
11 granted patents·2 pending applications·23 citations·filing 2009–2017
85Inventor score
Top patents by PatentIndex Score
13 records- 0195US10267745B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 23, 2019·7 cites·6 claims
- 0285US8359661B2Magnetic device inspection apparatus and magnetic device inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 22, 2013·10 cites·18 claims
- 0378US9759666B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 12, 2017·1 cites·10 claims
- 0470US8953156B2Defect detection method and defect detection device and defect observation device provided with sameOTANI YUKO·Filed 2010·Granted Feb 10, 2015·1 cites·12 claims
- 0566US9217718B2Defect detection method and defect detection device and defect observation device provided with sameHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 22, 2015·0 cites·12 claims
- 0661US8656509B2Scanning probe microscope and surface shape measuring method using sameWATANABE MASAHIRO·Filed 2011·Granted Feb 18, 2014·1 cites·7 claims
- 0760US8483035B2Thermally assisted magnetic recording head inspection method and apparatusZHANG KAIFENG·Filed 2012·Granted Jul 9, 2013·1 cites·11 claims
- 0856US8982332B2Distance measuring device and distance measuring methodTACHIZAKI TAKEHIRO·Filed 2011·Granted Mar 17, 2015·2 cites·8 claims
- 0956US8787134B2Thermally assisted magnetic recording head inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·0 cites·10 claims
- 1049US9134279B2Internal defect inspection method and apparatus for the sameNAKATA TOSHIHIKO·Filed 2011·Granted Sep 15, 2015·0 cites·14 claims
- 1141US2015177276A1Scanning Probe MiscroscopeHITACHI LTD·Filed 2013·Application pending·0 cites
- 1240US9063168B2Scanning probe microscope and measurement method using sameTACHIZAKI TAKEHIRO·Filed 2012·Granted Jun 23, 2015·0 cites·15 claims
- 1338US2011194101A1Supersensitization of defect inspection methodTACHIZAKI TAKEHIRO·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →