Inventor · disambiguated record
Takayoshi Watanabe
Also filed as: WATANABE TAKAYOSHI
12 granted patents·3 pending applications·387 citations·filing 1986–2017
93Inventor score
Top patents by PatentIndex Score
15 records- 0189US6305230B1Connector and probing systemHITACHI LTD·Filed 1998·Granted Oct 23, 2001·79 cites·14 claims
- 0288US4713494AMultilayer ceramic circuit boardHITACHI LTD·Filed 1986·Granted Dec 15, 1987·66 cites·17 claims
- 0383US5256247ALiquid etchant composition for thin film resistor elementHITACHI LTD·Filed 1991·Granted Oct 26, 1993·40 cites·5 claims
- 0479US6455335B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2000·Granted Sep 24, 2002·17 cites·10 claims
- 0577US6566150B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2002·Granted May 20, 2003·15 cites·1 claims
- 0676US6759258B2Connection device and test systemRENESAS TECH CORP·Filed 2001·Granted Jul 6, 2004·14 cites·17 claims
- 0764US7541202B2Connection device and test systemRENESAS TECH CORP·Filed 2007·Granted Jun 2, 2009·1 cites·10 claims
- 0856US5379765AMonitoring apparatus for use in obtaining bronchial electrocardiogramFiled 1992·Granted Jan 10, 1995·125 cites·12 claims
- 0954US7285430B2Connection device and test systemHITACHI LTD·Filed 2004·Granted Oct 23, 2007·3 cites·8 claims
- 1053US6197603B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 1998·Granted Mar 6, 2001·12 cites·4 claims
- 1152US2009209053A1Connection device and test systemKASUKABE SUSUMU·Filed 2009·Application pending·0 cites
- 1250US7198962B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2003·Granted Apr 3, 2007·3 cites·5 claims
- 1343US7390732B1Method for producing a semiconductor device with pyramidal bump electrodes bonded onto pad electrodes arranged on a semiconductor chipHITACHI LTD·Filed 1998·Granted Jun 24, 2008·12 cites·29 claims
- 1441US2017278076A1Input assistance method, computer-readable recording medium, and input assistance deviceFUJITSU LTD·Filed 2017·Application pending·0 cites
- 1531US2017278077A1Input assistance method, computer-readable recording medium, and input assistance deviceFUJITSU LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →