Inventor · disambiguated record
Teng-Chun Hsuan
Also filed as: HSUAN TENG-CHUN
5 granted patents·5 pending applications·20 citations·filing 2011–2014
71Inventor score
Top patents by PatentIndex Score
10 records- 0193US8754448B2Semiconductor device having epitaxial layerLIAO CHIN-I·Filed 2011·Granted Jun 17, 2014·18 cites·9 claims
- 0261US8519390B2Test pattern for measuring semiconductor alloys using X-ray DiffractionLIAO CHIN-I·Filed 2011·Granted Aug 27, 2013·1 cites·20 claims
- 0359US8716750B2Semiconductor device having epitaxial structuresLIAO CHIN-I·Filed 2011·Granted May 6, 2014·1 cites·19 claims
- 0456US8927376B2Semiconductor device and method of forming epitaxial layerUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 6, 2015·0 cites·9 claims
- 0547US2014191285A1Semiconductor device having epitaxial structuresUNITED MICROELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 0636US2012299157A1Semiconductor process and fabricated structure thereofHSUAN TENG-CHUN·Filed 2011·Application pending·0 cites
- 0736US2012309166A1Process for forming shallow trench isolation structureHSUAN TENG-CHUN·Filed 2011·Application pending·0 cites
- 0836US2013069172A1Semiconductor device and method for fabricating the sameLIAO CHIN-I·Filed 2011·Application pending·0 cites
- 0936US2013122684A1Semiconductor process for removing oxide layerHSUAN TENG-CHUN·Filed 2011·Application pending·0 cites
- 1034US8765588B2Semiconductor processHUANG PONG-WEY·Filed 2011·Granted Jul 1, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →