Inventor · disambiguated record
Teruhide Nishino
Also filed as: NISHINO TERUHIDE
3 granted patents·1 pending application·6 citations·filing 2008–2015
59Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0167US7832353B2Semiconductor manufacturing apparatus equipped with wafer inspection device and inspection techniquesASM JAPAN·Filed 2008·Granted Nov 16, 2010·3 cites·14 claims
- 0262US8666551B2Semiconductor-processing apparatus equipped with robot diagnostic moduleTAKIZAWA MASAHIRO·Filed 2008·Granted Mar 4, 2014·2 cites·18 claims
- 0356US10822698B2Substrate processing apparatus, recording medium, and method of processing substratesASM IP HOLDING BV·Filed 2015·Granted Nov 3, 2020·1 cites·9 claims
- 0444US2010014945A1Semiconductor processing apparatus having all-round type wafer handling chamberASM JAPAN·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →