Inventor · disambiguated record
Ted Taylor
Also filed as: TAYLOR TED · TAYLOR TED L · TAYLOR TED LYLE
20 granted patents·1 pending application·582 citations·filing 1987–2024
96Inventor score
Files withMICRON TECHNOLOGY INC13KIEHLBAUCH MARK2TAYLOR TED2BENSON RUSSELL A1INFINITY TRADING CO LTD1
Top patents by PatentIndex Score
21 records- 0196US4855098AMethod of forming candles and candle composition thereforTAYLOR TED·Filed 1987·Granted Aug 8, 1989·136 cites·14 claims
- 0295US6175417B1Method and apparatus for detecting defects in the manufacture of an electronic deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 16, 2001·92 cites·3 claims
- 0394US8088691B2Selective etch chemistries for forming high aspect ratio features and associated structuresKIEHLBAUCH MARK·Filed 2009·Granted Jan 3, 2012·23 cites·20 claims
- 0494US7517804B2Selective etch chemistries for forming high aspect ratio features and associated structuresMICRON TECHNOLOGIES INC·Filed 2006·Granted Apr 14, 2009·20 cites·16 claims
- 0591US8614151B2Method of etching a high aspect ratio contactBENSON RUSSELL A·Filed 2008·Granted Dec 24, 2013·22 cites·28 claims
- 0691US6326303B1Copper electroless deposition on a titanium-containing surfaceMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 4, 2001·43 cites·8 claims
- 0787US6126989ACopper electroless deposition on a titanium-containing surfaceMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 3, 2000·62 cites·20 claims
- 0886US6054172ACopper electroless deposition on a titanium-containing surfaceMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 25, 2000·58 cites·16 claims
- 0985US7537994B2Methods of forming semiconductor devices, assemblies and constructionsMICRON TECHNOLOGY INC·Filed 2006·Granted May 26, 2009·12 cites·5 claims
- 1085US6452677B1Method and apparatus for detecting defects in the manufacture of an electronic deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 17, 2002·67 cites·48 claims
- 1183US8791506B2Semiconductor devices, assemblies and constructionsTAYLOR TED·Filed 2011·Granted Jul 29, 2014·6 cites·12 claims
- 1279US12462370B2System for predicting properties of structures, imager system, and related methodsMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 4, 2025·0 cites·20 claims
- 1377US10145107B2Method of producing a plate-like construction with a double-wall structureUPONOR INFRA OY·Filed 2012·Granted Dec 4, 2018·5 cites·19 claims
- 1477US7883907B2Parameter measurement using multi-layer structuresMICRON TECHNOLOGY INC·Filed 2009·Granted Feb 8, 2011·6 cites·30 claims
- 1576US7642550B2Multi-layer structures for parameter measurementMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 5, 2010·6 cites·31 claims
- 1668US6054173ACopper electroless deposition on a titanium-containing surfaceMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·24 cites·10 claims
- 1767US11869178B2System for predicting properties of structures, imager system, and related methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 9, 2024·0 cites·18 claims
- 1856US10872403B2System for predicting properties of structures, imager system, and related methodsMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 22, 2020·0 cites·20 claims
- 1954US8044479B2Transistors, semiconductor devices, assemblies and constructionsMICRON TECHNOLOGY INC·Filed 2009·Granted Oct 25, 2011·0 cites·9 claims
- 2050US2012068366A1Selective etch chemistries for forming high aspect ratio features and associated structuresKIEHLBAUCH MARK·Filed 2011·Application pending·0 cites
- 2126USD383861SBicycle lightINFINITY TRADING CO LTD·Filed 1996·Granted Sep 16, 1997·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →