Inventor · disambiguated record
Thirupurasundari Jayaraman
Also filed as: JAYARAMAN THIRUPURASUNDARI
6 granted patents·1 pending application·15 citations·filing 2014–2022
74Inventor score
Top patents by PatentIndex Score
7 records- 0186US9865512B2Dynamic design attributes for wafer inspectionKLA TENCOR CORP·Filed 2014·Granted Jan 9, 2018·10 cites·33 claims
- 0274US9996942B2Sub-pixel alignment of inspection to designKLA TENCOR CORP·Filed 2016·Granted Jun 12, 2018·3 cites·22 claims
- 0363US10209628B2System and method for defect classification based on electrical design intentKLA TENCOR CORP·Filed 2016·Granted Feb 19, 2019·1 cites·40 claims
- 0460US10204416B2Automatic deskew using design files or inspection imagesKLA TENCOR CORP·Filed 2016·Granted Feb 12, 2019·1 cites·20 claims
- 0546US2022270212A1Methods for improving optical inspection and metrology image quality using chip design dataKLA CORP·Filed 2022·Application pending·0 cites
- 0645US10620134B2Creating defect samples for array regionsKLA TENCOR CORP·Filed 2018·Granted Apr 14, 2020·0 cites·21 claims
- 0737US10387601B2Methods to store dynamic layer content inside a design fileKLA TENCOR CORP·Filed 2016·Granted Aug 20, 2019·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →