Inventor · disambiguated record
Tim H. Bossart
Also filed as: BOSSART TIM · BOSSART TIM H
9 granted patents·2 pending applications·90 citations·filing 1997–2018
87Inventor score
Top patents by PatentIndex Score
11 records- 0184US10388601B2Semiconductor devices including conductive lines and methods of forming the semiconductor devicesMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 20, 2019·4 cites·18 claims
- 0282US6484060B1Layout for measurement of overlay errorMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·31 cites·22 claims
- 0376US6675053B2Layout for measurement of overlay errorMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·21 cites·15 claims
- 0475US6822342B2Raised-lines overlay semiconductor targets and method of making the sameMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 23, 2004·14 cites·9 claims
- 0571US6914017B1Residue free overlay targetMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 5, 2005·10 cites·6 claims
- 0655US10811355B2Methods of forming semiconductor devicesMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 20, 2020·0 cites·20 claims
- 0751US2006017074A1Raised-lines overlay semiconductor targets and method of making the sameBALUSWAMY PARY·Filed 2005·Application pending·0 cites
- 0849US9911693B2Semiconductor devices including conductive lines and methods of forming the semiconductor devicesMICRON TECHNOLOGY INC·Filed 2015·Granted Mar 6, 2018·0 cites·38 claims
- 0945US8658336B2Methods of correcting for variation across substrates during photolithographyHE YUAN·Filed 2012·Granted Feb 25, 2014·0 cites·21 claims
- 1044US2005070069A1Raised-lines overlay semiconductor targets and method of making the sameFiled 2004·Application pending·0 cites
- 1142US5952045AMethod and apparatus for improved coating of a semiconductor waferMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 14, 1999·10 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →