Inventor · disambiguated record
Tim Lesher
Also filed as: LESHER TIM
16 granted patents·1 pending application·337 citations·filing 2003–2023
95Inventor score
Technology areasG01R
Top patents by PatentIndex Score
17 records- 0198US7271603B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2006·Granted Sep 18, 2007·51 cites·53 claims
- 0297US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0396US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0494US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 0591US7057404B2Shielded probe for testing a device under testSHARP LAB OF AMERICA INC·Filed 2003·Granted Jun 6, 2006·31 cites·45 claims
- 0690US7498829B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 3, 2009·12 cites·47 claims
- 0790US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 0889US7501842B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 10, 2009·11 cites·53 claims
- 0988US7898273B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2009·Granted Mar 1, 2011·10 cites·29 claims
- 1088US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 1187US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 1286US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 1375US7876115B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2009·Granted Jan 25, 2011·7 cites·4 claims
- 1468US7492172B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2004·Granted Feb 17, 2009·12 cites·6 claims
- 1563US7394269B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jul 1, 2008·2 cites·12 claims
- 1660US11486898B2Multi-conductor transmission line probeFORMFACTOR INC·Filed 2021·Granted Nov 1, 2022·0 cites·10 claims
- 1747US2023393174A1Abbreviated Loopback AttenuationFORMFACTOR INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →