Inventor · disambiguated record
Ting-Ying Wu
Also filed as: WU TING-YING
19 granted patents·7 pending applications·5 citations·filing 2011–2025
88Inventor score
Files withREALTEK SEMICONDUCTOR CORP13TAIWAN SEMICONDUCTOR MFG CO LTD6INNOLUX CORP4ASUSTEK COMP INC2WANG WEN-SHAN1
Top patents by PatentIndex Score
26 records- 0187US12195866B2Plating membraneTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 14, 2025·0 cites·20 claims
- 0286US2025101628A1Plating membraneTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0381US12363928B2Surface damage control in diodesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jul 15, 2025·0 cites·20 claims
- 0480US2025311257A1Surface damage control in diodesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0575US12442968B2Electronic deviceINNOLUX CORP·Filed 2024·Granted Oct 14, 2025·0 cites·6 claims
- 0673US11814743B2Plating membraneTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 14, 2023·0 cites·20 claims
- 0772US12147069B2Backlight moduleINNOLUX CORP·Filed 2023·Granted Nov 19, 2024·0 cites·18 claims
- 0871US10274964B2Autonomous mobile robot and control method thereofASUSTEK COMP INC·Filed 2017·Granted Apr 30, 2019·2 cites·23 claims
- 0969US11973148B2Surface damage control in diodesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 30, 2024·0 cites·20 claims
- 1061US10353400B2Navigation system and navigation methodASUSTEK COMP INC·Filed 2017·Granted Jul 16, 2019·2 cites·17 claims
- 1160US11994558B2Electronic device test method and test deviceREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted May 28, 2024·0 cites·20 claims
- 1259US8614585B2Impedance correction device and method thereofWANG WEN-SHAN·Filed 2011·Granted Dec 24, 2013·1 cites·16 claims
- 1357US12462085B2Layout method and related non-transitory computer-readable mediumREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Nov 4, 2025·0 cites·20 claims
- 1457US2024266327A1Electronic deviceINNOLUX CORP·Filed 2024·Application pending·0 cites
- 1555US2024012263A1Electronic deviceINNOLUX CORP·Filed 2023·Application pending·0 cites
- 1652US11264352B2Electronic package structure with a core ground wire and chip thereofREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Mar 1, 2022·0 cites·13 claims
- 1752US2025076370A1Ic test method and ic test systemREALTEK SEMICONDUCTOR CORP·Filed 2024·Application pending·0 cites
- 1851US11711888B2Power line structureREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Jul 25, 2023·0 cites·17 claims
- 1950US11375608B2Electromagnetic band gap structure apparatusREALTEK SEMICONDUCTOR CORP·Filed 2020·Granted Jun 28, 2022·0 cites·19 claims
- 2049US2023244843A1Method for simulating system and associated electronic deviceREALTEK SEMICONDUCTOR CORP·Filed 2023·Application pending·0 cites
- 2142US12437802B2Signal quality optimization method and a signal quality optimization systemREALTEK SEMICONDUCTOR CORP·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
- 2240US2019096444A1Circuit for memory system and associated methodREALTEK SEMICONDUCTOR CORP·Filed 2017·Application pending·0 cites
- 2339US9948280B1Two-capacitor-based filter design method and two-capacitor-based filterREALTEK SEMICONDUCTOR CORP·Filed 2017·Granted Apr 17, 2018·0 cites·10 claims
- 2438US11862224B2Method for performing memory calibration, associated system on chip integrated circuit and non-transitory computer-readable mediumREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Jan 2, 2024·0 cites·8 claims
- 2538US10998016B2Memory device including noise-suppressing mechanismREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted May 4, 2021·0 cites·9 claims
- 2633US9955586B2Ball grid array formed on printed circuit boardREALTEK SEMICONDUCTOR CORP·Filed 2015·Granted Apr 24, 2018·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →