Inventor · disambiguated record
Tianrong Zhan
Also filed as: ZHAN TIANRONG
3 granted patents·2 pending applications·1 citations·filing 2018–2023
46Inventor score
Top patents by PatentIndex Score
5 records- 0166US11380594B2Automatic optimization of measurement accuracy through advanced machine learning techniquesKLA TENCOR CORP·Filed 2018·Granted Jul 5, 2022·1 cites·20 claims
- 0259US12379672B2Metrology of nanosheet surface roughness and profileKLA CORP·Filed 2023·Granted Aug 5, 2025·0 cites·40 claims
- 0358US2025053096A1Flexible Measurement Models For Model Based Measurements Of Semiconductor StructuresKLA CORP·Filed 2023·Application pending·0 cites
- 0444US2021375651A1Fleet Matching Of Semiconductor Metrology Tools Without Dedicated Quality Control WafersKLA CORP·Filed 2021·Application pending·0 cites
- 0541US12085515B2Methods and systems for selecting wafer locations to characterize cross-wafer variations based on high-throughput measurement signalsKLA CORP·Filed 2021·Granted Sep 10, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →