Inventor · disambiguated record
Toshiaki Fujii
Also filed as: FUJII TOSHIAKI
63 granted patents·15 pending applications·990 citations·filing 1986–2022
99Inventor score
Files withSII NANOTECHNOLOGY INC12EBARA CORP10EBARA RES CO LTD9SEIKO INSTR INC9NAT INST INF & COMM TECH4
Top patents by PatentIndex Score
78 records- 0192US8548064B2Video encoding method and decoding method by using selected parallax for parallax compensation, apparatuses therefor, programs therefor, and storage media for storing the programsKITAHARA MASAKI·Filed 2006·Granted Oct 1, 2013·23 cites·8 claims
- 0292US7442942B2Charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·20 cites·5 claims
- 0392US4750917AMethod of and apparatus for cleaning air by irradiation of ultraviolet raysEBARA CORP·Filed 1986·Granted Jun 14, 1988·69 cites·25 claims
- 0491US6736354B2Airplane fuel supply system and airplane wing pipeline assembly methodHONDA MOTOR CO LTD·Filed 2003·Granted May 18, 2004·65 cites·3 claims
- 0590US9679743B2Sample processing evaluation apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Jun 13, 2017·5 cites·18 claims
- 0689US7718981B2Composite charged-particle beam systemSII NANOTECHNOLOGY INC·Filed 2008·Granted May 18, 2010·12 cites·1 claims
- 0789US6620385B2Method and apparatus for purifying a gas containing contaminantsEBARA CORP·Filed 2001·Granted Sep 16, 2003·39 cites·11 claims
- 0886US7700367B2Method of making lamina specimenSII NANOTECHNOLOGY INC·Filed 2004·Granted Apr 20, 2010·23 cites·1 claims
- 0986US5574280AFocused ion beam apparatus and methodSEIKO INSTR INC·Filed 1994·Granted Nov 12, 1996·95 cites·5 claims
- 1085US6870161B2Apparatus for processing and observing a sampleSII NANOTECHNOLOGY INC·Filed 2003·Granted Mar 22, 2005·23 cites·20 claims
- 1185US6838685B1Ion beam apparatus, ion beam processing method and sample holder memberSII NANOTECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·26 cites·17 claims
- 1285US5154733APhotoelectron emitting member and method of electrically charging fine particles with photoelectronsEBARA RES CO LTD·Filed 1991·Granted Oct 13, 1992·48 cites·15 claims
- 1382US7095024B2TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscopeJEOL LTD·Filed 2004·Granted Aug 22, 2006·22 cites·9 claims
- 1481US8274049B2Sample processing and observing methodTANAKA KEIICHI·Filed 2011·Granted Sep 25, 2012·5 cites·7 claims
- 1581US6391118B2Method for removing particles from surface of articleEBARA CORP·Filed 2001·Granted May 21, 2002·21 cites·19 claims
- 1678US9919473B2Method for producing fiber-reinforced resin bonded bodyHONDA MOTOR CO LTD·Filed 2015·Granted Mar 20, 2018·2 cites·5 claims
- 1778US9046472B2Crystal analysis apparatus, composite charged particle beam device, and crystal analysis methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Jun 2, 2015·2 cites·10 claims
- 1876US8274063B2Composite focused ion beam device, process observation method using the same, and processing methodKAITO TAKASHI·Filed 2008·Granted Sep 25, 2012·4 cites·20 claims
- 1976US6939859B1Skin preparations for external useCCI CORP·Filed 2000·Granted Sep 6, 2005·10 cites·4 claims
- 2076US6205676B1Method and apparatus for removing particles from surface of articleEBARA CORP·Filed 1998·Granted Mar 27, 2001·38 cites·9 claims
- 2176US6159421AMethod of cleaning gasesEBARA CORP·Filed 1996·Granted Dec 12, 2000·51 cites·40 claims
- 2276US5922105AMethod and apparatus for the preparation of clean gasesEBARA RES CO LTD·Filed 1998·Granted Jul 13, 1999·46 cites·24 claims
- 2376US5743940AProcess for producing gas adsorbentJAPAN ATOMIC ENERGY RES INST·Filed 1994·Granted Apr 28, 1998·35 cites·40 claims
- 2475US9314990B2Resin composite structure and method for producing the sameHONDA MOTOR CO LTD·Filed 2014·Granted Apr 19, 2016·2 cites·13 claims
- 2575US7531796B2Focused ion beam apparatus and sample section forming and thin-piece sample preparing methodsSII NANOTECHNOLOGY INC·Filed 2007·Granted May 12, 2009·3 cites·6 claims
- 2674US5225000AMethod for cleaning closed spaces with ultraviolet raysEBARA RES CO LTD·Filed 1991·Granted Jul 6, 1993·33 cites·1 claims
- 2773US8664598B2Electron microscope and specimen analyzing methodHASUDA MASAKATSU·Filed 2011·Granted Mar 4, 2014·4 cites·16 claims
- 2873US6300628B1Focused ion beam machining method and device thereofSEIKO INSTR INC·Filed 1998·Granted Oct 9, 2001·23 cites·32 claims
- 2971US8269194B2Composite focused ion beam device, and processing observation method and processing method using the sameKAITO TAKASHI·Filed 2008·Granted Sep 18, 2012·3 cites·19 claims
- 3071US7755044B2Apparatus for working and observing samples and method of working and observing cross sectionsSII NANOTECHNOLOGY INC·Filed 2008·Granted Jul 13, 2010·2 cites·11 claims
- 3171US5969355AFocused ion beam optical axis adjustment method and focused ion beam apparatusSEIKO INSTR INC·Filed 1997·Granted Oct 19, 1999·26 cites·24 claims
- 3269US8451894B2Video encoding method and decoding method, apparatuses therefor, programs therefor, and storage media for storing the programs by using parallax compensationTANIMOTO MASAYUKI·Filed 2007·Granted May 28, 2013·3 cites·20 claims
- 3368US11588168B2Separator for fuel cell or current collecting member for fuel cell, and solid polymer electrolyte fuel cellPLASMA ION ASSIST CO LTD·Filed 2020·Granted Feb 21, 2023·0 cites·5 claims
- 3467US7518125B2Processing apparatus using focused charged particle beamSII NANOTECHNOLOGY INC·Filed 2006·Granted Apr 14, 2009·1 cites·18 claims
- 3566US7276691B2Ion beam device and ion beam processing methodSII NANOTECHNOLOGY INC·Filed 2003·Granted Oct 2, 2007·6 cites·19 claims
- 3665US6340381B1Method and apparatus for the preparation of clean gasesEBARA RES CO LTD·Filed 2000·Granted Jan 22, 2002·11 cites·29 claims
- 3764US5467462AEvent driven logic simulator for partial simulationNEC CORP·Filed 1992·Granted Nov 14, 1995·42 cites·1 claims
- 3863US7029518B2Method and apparatus for the preparation of clean gasesEBARA RES CO LTD·Filed 2005·Granted Apr 18, 2006·1 cites·24 claims
- 3962US6489612B1Method of measuring film thicknessSEIKO INSTR INC·Filed 2000·Granted Dec 3, 2002·5 cites·24 claims
- 4061US8306264B2Section processing method and its apparatusFUJII TOSHIAKI·Filed 2009·Granted Nov 6, 2012·3 cites·7 claims
- 4159US9470642B2Crystal analysis apparatus, composite charged particle beam device, and crystal analysis methodHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Oct 18, 2016·0 cites·5 claims
- 4258US5380503AStockerEBARA RES CO LTD·Filed 1993·Granted Jan 10, 1995·29 cites·17 claims
- 4356US10693169B2Separator for fuel cell or current collecting member for fuel cell, and manufacturing method thereofPLASMA ION ASSIST CO LTD·Filed 2015·Granted Jun 23, 2020·0 cites·5 claims
- 4456US6911064B2Method and apparatus for the preparation of clean gasesEBARA RES CO LTD·Filed 2003·Granted Jun 28, 2005·4 cites·22 claims
- 4554US2007187226A1Method and apparatus for purifying a gas containing contaminantsEBARA CORP·Filed 2007·Application pending·0 cites
- 4652US7298729B2Radio communication system and destination portable terminal time identification methodNEC CORP·Filed 2002·Granted Nov 20, 2007·2 cites·8 claims
- 4751US5060805APhotoelectron emitting memberEBARA RES CO LTD·Filed 1990·Granted Oct 29, 1991·15 cites·11 claims
- 4851US2022383589A1Image processing apparatus, image processing method, method for generating learned model, and storage mediumCANON KK·Filed 2022·Application pending·0 cites
- 4949US5917186AFocused ion beam optical axis adjustment method and focused ion beam apparatusSEIKO INSTR INC·Filed 1997·Granted Jun 29, 1999·8 cites·14 claims
- 5048US7736893B2Nanobio device of imitative anatomy structureSII NANOTECHNOLOGY INC·Filed 2006·Granted Jun 15, 2010·0 cites·13 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →