Inventor · disambiguated record
Toshiaki Saishoji
Also filed as: SAISHOJI TOSHIAKI
10 granted patents·6 pending applications·108 citations·filing 1996–2007
90Inventor score
Files withKOMATSU DENSHI KINZOKU KK9SUMCO TECHXIV CORP2KOMATSU ELECTRIC METALS CO LTD1KOMATSU ELECTRONIC METAL CO LT1KOTOOKA TOSHIROU1
Top patents by PatentIndex Score
16 records- 0186US6869478B2Method for producing silicon single crystal having no flawKOMATSU DENSHI KINZOKU KK·Filed 2001·Granted Mar 22, 2005·29 cites·5 claims
- 0278US6977010B2Apparatus for pulling single crystal by CZ methodKOMATSU DENSHI KINZOKU KK·Filed 2003·Granted Dec 20, 2005·12 cites·8 claims
- 0368US7141113B1Production method for silicon single crystal and production device for single crystal ingot, and heat treating method for silicon crystal waferKOMATSU DENSHI KINZOKU KK·Filed 1999·Granted Nov 28, 2006·22 cites·5 claims
- 0466US7727334B2Apparatus for pulling single crystal by CZ methodSUMCO TECHXIV CORP·Filed 2007·Granted Jun 1, 2010·2 cites·12 claims
- 0562US2008311019A1Apparatus for pulling single crystal by CZ methodKOMATSU DENSHI KINZOKU KK·Filed 2007·Application pending·0 cites
- 0660US6273944B1Silicon wafer for hydrogen heat treatment and method for manufacturing the sameKOMATSU DENSHI KINZOKU KK·Filed 2000·Granted Aug 14, 2001·3 cites·3 claims
- 0759US5824152ASemiconductor single-crystal pulling apparatusKOMATSU DENSHI KINZOKU KK·Filed 1996·Granted Oct 20, 1998·20 cites·13 claims
- 0850US2008311021A1Apparatus for pulling single crystal by CZ methodKOMATSU DENSHI KINZOKU KK·Filed 2007·Application pending·0 cites
- 0947US6179910B1Method for manufacturing silicon single crystals and wafers adapted for producing semiconductorsKOMATSU DENSHI KINZOKU KK·Filed 1999·Granted Jan 30, 2001·8 cites·6 claims
- 1046US2008115720A1Apparatus and method for manufacturing semiconductor single crystalSUMCO TECHXIV KABUSHIKI KAISHA·Filed 2007·Application pending·0 cites
- 1144US2007240629A1Method for manufacturing a silicon single crystalSUMCO TECHXIV CORP·Filed 2007·Application pending·0 cites
- 1239US6056931ASilicon wafer for hydrogen heat treatment and method for manufacturing the sameKOMATSU ELECTRONIC METAL CO LT·Filed 1998·Granted May 2, 2000·4 cites·3 claims
- 1339US2008302295A1Method of Evaluating Quality of Silicon Single CrystalKOTOOKA TOSHIROU·Filed 2005·Application pending·0 cites
- 1437US6042646ASimple method for detecting temperature distributions in single crystals and method for manufacturing silicon single crystals by employing the simple methodKOMATSU ELECTRIC METALS CO LTD·Filed 1998·Granted Mar 28, 2000·5 cites·6 claims
- 1537US2006016387A1Silicon wafer, its manufacturing method, and its manufacturing apparatusYOKOYAMA TAKASHI·Filed 2003·Application pending·0 cites
- 1636US5948159AMethod of controlling defects of a silicon single crystalKOMATSU DENSHI KINZOKU KK·Filed 1998·Granted Sep 7, 1999·3 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when Toshiaki Saishoji files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →