Inventor · disambiguated record
Toshiaki Tanigaki
Also filed as: TANIGAKI TOSHIAKI
13 granted patents·8 pending applications·31 citations·filing 2008–2024
87Inventor score
Top patents by PatentIndex Score
21 records- 0181US8853648B2Sample holder, method for use of the sample holder, and charged particle deviceNAGAKUBO YASUHIRA·Filed 2010·Granted Oct 7, 2014·5 cites·12 claims
- 0278US8785851B2Interference electron microscopeRIKEN·Filed 2013·Granted Jul 22, 2014·4 cites·31 claims
- 0377US7700927B2Heating stage for a micro-sampleHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 20, 2010·5 cites·14 claims
- 0475US8729497B2Sample device for charged particle beamNAGAKUBO YASUHIRA·Filed 2011·Granted May 20, 2014·4 cites·15 claims
- 0571US8586922B2Transmission electron microscope and sample observation methodNAGAOKI ISAO·Filed 2010·Granted Nov 19, 2013·4 cites·8 claims
- 0668US8426811B2Electron microscopeNAGAOKI ISAO·Filed 2009·Granted Apr 23, 2013·2 cites·11 claims
- 0759US12406825B2Interference scanning transmission electron microscopeHITACHI LTD·Filed 2022·Granted Sep 2, 2025·0 cites·6 claims
- 0858US2024192152A1Information processing system and phase analysis systemHITACHI LTD·Filed 2023·Application pending·0 cites
- 0958US2024429020A1Sample holder, electron microscope system and sample observation methodHITACHI LTD·Filed 2024·Application pending·0 cites
- 1058US2024404781A1Sample holder and electron microscopeHITACHI LTD·Filed 2024·Application pending·0 cites
- 1158US2025157786A1Charged Particle Beam ApparatusHITACHI LTD·Filed 2024·Application pending·0 cites
- 1257US2025022678A1Environmental cell and electron microscopeHITACHI LTD·Filed 2024·Application pending·0 cites
- 1356US10872743B2Sample holding mechanism, manufacturing method for same, and charged particle beam deviceHITACHI LTD·Filed 2018·Granted Dec 22, 2020·0 cites·12 claims
- 1453US2025253117A1Sample Holding Tool, Electron Ray Device, and Manufacturing Method for Sample Holding ToolHITACHI LTD·Filed 2022·Application pending·0 cites
- 1548US2025316442A1Microscope SystemHITACHI LTD·Filed 2022·Application pending·0 cites
- 1647US11011344B2Interferometric electron microscopeHITACHI LTD·Filed 2020·Granted May 18, 2021·0 cites·12 claims
- 1744US8772715B2Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beamsRIKEN·Filed 2013·Granted Jul 8, 2014·0 cites·20 claims
- 1838US10629410B2Electron microscope for magnetic field measurement and magnetic field measurement methodHITACHI LTD·Filed 2017·Granted Apr 21, 2020·0 cites·15 claims
- 1937USD651226SSample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted Dec 27, 2011·4 cites·1 claims
- 2036US2013163076A1Transmission interference microscopeNAGAOKI ISAO·Filed 2011·Application pending·0 cites
- 2133USD660335SFixation device for a sample case for an electron microscopeNAGAKUBO YASUHIRA·Filed 2011·Granted May 22, 2012·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →