Inventor · disambiguated record
Toshie Yaguchi
Also filed as: YAGUCHI TOSHIE
19 granted patents·3 pending applications·168 citations·filing 1997–2021
93Inventor score
Files withHITACHI HIGH TECH CORP14YAGUCHI TOSHIE4HITACHI LTD2HITACHI SCIENCE SYSTEMS LTD1KUBO TAKASHI1
Top patents by PatentIndex Score
22 records- 0194US7612337B2Focused ion beam system and a method of sample preparation and observationHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 3, 2009·30 cites·10 claims
- 0288US7863564B2Electric charged particle beam microscope and microscopyHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 4, 2011·13 cites·7 claims
- 0388US6495838B1Sample heating holder, method of observing a sample and charged particle beam apparatusHITACHI LTD·Filed 1999·Granted Dec 17, 2002·57 cites·12 claims
- 0485US8878144B2Electron microscope and sample holderYAGUCHI TOSHIE·Filed 2010·Granted Nov 4, 2014·9 cites·14 claims
- 0585US8835847B2Sample holding apparatus for electron microscope, and electron microscope apparatusYAGUCHI TOSHIE·Filed 2012·Granted Sep 16, 2014·8 cites·20 claims
- 0682US8604429B2Electron beam device and sample holding device for electron beam deviceYAGUCHI TOSHIE·Filed 2010·Granted Dec 10, 2013·7 cites·12 claims
- 0779US7622714B2Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 24, 2009·6 cites·15 claims
- 0876US10068745B2Charged particle beam device and sample holder for charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 4, 2018·3 cites·10 claims
- 0974US6992286B2Material characterization systemHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted Jan 31, 2006·11 cites·13 claims
- 1068US5898177AElectron microscopeHITACHI LTD·Filed 1997·Granted Apr 27, 1999·20 cites·8 claims
- 1164US8588499B2Image processing method, image processing system, and X-ray computed tomography systemKUBO TAKASHI·Filed 2011·Granted Nov 19, 2013·2 cites·22 claims
- 1261US9099281B2Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatusYAGUCHI TOSHIE·Filed 2010·Granted Aug 4, 2015·1 cites·28 claims
- 1358US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 1455US9378922B2Electron microscope and electron microscope sample retaining deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 28, 2016·0 cites·32 claims
- 1553US12183542B2Transmission electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 31, 2024·0 cites·12 claims
- 1651US2024266141A1Sample Holder and Analysis SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1750US11177109B2Specimen holder and charged particle beam device provided with sameHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 16, 2021·0 cites·26 claims
- 1849US2008093565A1Charged particle beam system and its specimen holderHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 1944US2024186103A1Transmission Electron MicroscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2043US10535497B2Electron microscope and imaging methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 14, 2020·0 cites·14 claims
- 2139US9754762B2Electron microscope and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Sep 5, 2017·0 cites·9 claims
- 2237US12170184B2Transmission electron microscope and inspection method using transmission electron microscopeHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 17, 2024·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →