Inventor · disambiguated record
Toshiaki Yonezu
Also filed as: YONEZU TOSHIAKI
13 granted patents·5 pending applications·48 citations·filing 2002–2019
89Inventor score
Top patents by PatentIndex Score
18 records- 0184US7706202B2Semiconductor device having electrical fuses with less power consumption and interconnection arrangementRENESAS TECH CORP·Filed 2007·Granted Apr 27, 2010·11 cites·25 claims
- 0283US8331185B2Semiconductor device having electrical fuses with less power consumption and interconnection arrangementOBAYASHI SHIGEKI·Filed 2010·Granted Dec 11, 2012·7 cites·5 claims
- 0382US7745905B2Semiconductor device and a method of increasing a resistance value of an electric fuseRENESAS TECH CORP·Filed 2007·Granted Jun 29, 2010·7 cites·17 claims
- 0477US7705418B2Semiconductor device and fuse blowout methodRENESAS TECH CORP·Filed 2006·Granted Apr 27, 2010·7 cites·5 claims
- 0573US7808076B2Semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Oct 5, 2010·4 cites·35 claims
- 0664US10923419B2Semiconductor device and a method of increasing a resistance value of an electric fuseRENESAS ELECTRONICS CORP·Filed 2019·Granted Feb 16, 2021·0 cites·16 claims
- 0763US8598680B2Semiconductor device with electrical fuseYONEZU TOSHIAKI·Filed 2011·Granted Dec 3, 2013·2 cites·9 claims
- 0858US2018138121A1Semiconductor device and a method of increasing a resistance value of an electric fuseRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
- 0957US9893013B2Semiconductor device and a method of increasing a resistance value of an electric fuseRENESAS ELECTRONICS CORP·Filed 2016·Granted Feb 13, 2018·0 cites·10 claims
- 1057US6667915B2Semiconductor memory device having redundancy structure with defect relieving functionMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 23, 2003·10 cites·6 claims
- 1156US2014021559A1Semiconductor device and a method of increasing a resistance value of an electric fuseRENESAS ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1255US9508641B2Semiconductor device and a method increasing a resistance value of an electric fuseRENESAS ELECTRONICS CORP·Filed 2015·Granted Nov 29, 2016·0 cites·9 claims
- 1349US2010264514A1Semiconductor device and a method of increasing a resistance value of an electric fuseIWAMOTO TAKESHI·Filed 2010·Application pending·0 cites
- 1445US8487402B2Semiconductor deviceKONO KAZUSHI·Filed 2010·Granted Jul 16, 2013·0 cites·16 claims
- 1545US8487403B2Semiconductor deviceKONO KAZUSHI·Filed 2010·Granted Jul 16, 2013·0 cites·33 claims
- 1644US8723291B2Semiconductor integrated circuitYONEZU TOSHIAKI·Filed 2012·Granted May 13, 2014·0 cites·4 claims
- 1744US2008237787A1Semiconductor integrated circuitYONEZU TOSHIAKI·Filed 2007·Application pending·0 cites
- 1844US2010178752A1Semiconductor device and fuse blowout methodRENESAS TECH CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →