Inventor · disambiguated record
Tsunenori Nomaguchi
Also filed as: NOMAGUCHI TSUNENORI
26 granted patents·7 pending applications·20 citations·filing 2010–2022
92Inventor score
Files withHITACHI HIGH TECH CORP28NOMAGUCHI TSUNENORI3AGEMURA TOSHIHIDE1HITACHI HIGH-TECNOLOGIES CORP1
Top patents by PatentIndex Score
33 records- 0184US9761409B2Composite charged particle detector, charged particle beam device, and charged particle detectorHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 12, 2017·5 cites·9 claims
- 0281US11067391B2Charged particle beam device and sample thickness measurement methodHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 20, 2021·3 cites·14 claims
- 0379US12119202B2Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 15, 2024·2 cites·16 claims
- 0478US11335532B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 17, 2022·2 cites·12 claims
- 0578US11264201B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 1, 2022·3 cites·13 claims
- 0677US11268915B2Charged particle beam device, method for processing sample, and observation methodHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 8, 2022·2 cites·13 claims
- 0773US11817289B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2022·Granted Nov 14, 2023·0 cites·14 claims
- 0870US10886101B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 5, 2021·1 cites·10 claims
- 0967US8455820B2Composite charged particle beams apparatusAGEMURA TOSHIHIDE·Filed 2010·Granted Jun 4, 2013·2 cites·37 claims
- 1056US10128081B2Composite charged particle beam detector, charged particle beam device, and charged particle beam detectorHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 13, 2018·0 cites·9 claims
- 1156US9478389B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 25, 2016·0 cites·7 claims
- 1255US12176180B2Method for producing lamella, analysis system and method for analyzing sampleHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 24, 2024·0 cites·14 claims
- 1355US11143606B2Particle measuring device and particle measuring methodHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 12, 2021·0 cites·15 claims
- 1452US11784022B2Electron beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 10, 2023·0 cites·8 claims
- 1551US2025232947A1Charged Particle Beam SystemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1650US9355814B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted May 31, 2016·0 cites·18 claims
- 1750US2025062096A1Charged Particle Beam Device, and Beam Deflection Method in Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1849US11798776B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 24, 2023·0 cites·15 claims
- 1946US12374520B2Tweezers, conveyance device, and method for conveying sample pieceHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 29, 2025·0 cites·14 claims
- 2045US11183359B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 23, 2021·0 cites·10 claims
- 2145US11107656B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 31, 2021·0 cites·12 claims
- 2245US2024412941A1Lamella Mounting Method, and Analysis SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2343US9966218B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted May 8, 2018·0 cites·20 claims
- 2443US2016379797A1Charged Particle Beam ApparatusHITACHI HIGH-TECNOLOGIES CORP·Filed 2014·Application pending·0 cites
- 2541US12436114B2Semiconductor analysis systemHITACHI HIGH TECH CORP·Filed 2020·Granted Oct 7, 2025·0 cites·5 claims
- 2641US12347707B2Semiconductor analysis systemHITACHI HIGH TECH CORP·Filed 2020·Granted Jul 1, 2025·0 cites·9 claims
- 2739US11430630B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 30, 2022·0 cites·13 claims
- 2839US11164716B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 2, 2021·0 cites·14 claims
- 2938US11640897B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted May 2, 2023·0 cites·9 claims
- 3037US8581219B2Composite charged-particle-beam apparatusNOMAGUCHI TSUNENORI·Filed 2011·Granted Nov 12, 2013·0 cites·6 claims
- 3135US2014123898A1Charged particle beam deviceNOMAGUCHI TSUNENORI·Filed 2012·Application pending·0 cites
- 3234US2013248733A1Charged particle beam apparatus and method of irradiating charged particle beamNOMAGUCHI TSUNENORI·Filed 2011·Application pending·0 cites
- 3331US2019385810A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →