Inventor · disambiguated record
Tsuyoshi Sendoda
Also filed as: SENDODA TSUYOSHI
5 granted patents·1 pending application·23 citations·filing 2001–2024
73Inventor score
Top patents by PatentIndex Score
6 records- 0191US12009269B2Virtual metrology for feature profile prediction in the production of memory devicesSANDISK TECHNOLOGIES LLC·Filed 2022·Granted Jun 11, 2024·4 cites·20 claims
- 0263US12135542B2Modelling and prediction of virtual inline quality control in the production of memory devicesSANDISK TECHNOLOGIES LLC·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 0362US7054786B2Operation monitoring method for treatment apparatusTOKYO ELECTRON LTD·Filed 2001·Granted May 30, 2006·10 cites·30 claims
- 0460US7341644B2Method for predicting consumption of consumable part, method for predicting deposited-film thickness, and plasma processorTOKYO ELECTRON LTD·Filed 2001·Granted Mar 11, 2008·9 cites·2 claims
- 0554US2024387295A1Modelling and prediction of virtual quality control data incorporating area location in the production of memory devicesSANDISK TECHNOLOGIES INC·Filed 2024·Application pending·0 cites
- 0649US12105137B2Virtual quality control interpolation and process feedback in the production of memory devicesSANDISK TECHNOLOGIES LLC·Filed 2021·Granted Oct 1, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →