Inventor · disambiguated record
Varoujan Chakarian
Also filed as: CHAKARIAN VAROUJAN
7 granted patents·6 pending applications·45 citations·filing 2006–2024
79Inventor score
Top patents by PatentIndex Score
13 records- 0194US11808746B2Concentration sensor for precursor delivery systemAPPLIED MATERIALS INC·Filed 2021·Granted Nov 7, 2023·2 cites·20 claims
- 0292US8045145B1Systems and methods for acquiring information about a defect on a specimenKLA TENCOR TECH CORP·Filed 2007·Granted Oct 25, 2011·37 cites·31 claims
- 0380US2024019410A1Concentration sensor for precursor delivery systemAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0477US2024429077A1Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0577US2024420975A1Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0673US7247849B1Automated focusing of electron imageKLA TENCOR TECH CORP·Filed 2006·Granted Jul 24, 2007·6 cites·7 claims
- 0767US2025391006A1Implementing features generated using discrete effective medium refractive analysis of patterned substratesAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0866US12080574B2Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2020·Granted Sep 3, 2024·0 cites·16 claims
- 0960US12462369B2Method for image-based sensor trace analysisAPPLIED MATERIALS INC·Filed 2023·Granted Nov 4, 2025·0 cites·20 claims
- 1059US2025244122A1Multi-purpose confocal sensor systemsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1158US12469686B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·20 claims
- 1255US12467136B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·19 claims
- 1353US2022081758A1Methods and apparatus for in-situ deposition monitoringAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →