Inventor · disambiguated record
Vasco Tomas Tenner
Also filed as: TENNER VASCO TOMAS
12 granted patents·6 pending applications·18 citations·filing 2018–2024
86Inventor score
Top patents by PatentIndex Score
18 records- 0196US12066764B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2023·Granted Aug 20, 2024·2 cites·20 claims
- 0295US11125806B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2019·Granted Sep 21, 2021·5 cites·15 claims
- 0395US10816909B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2018·Granted Oct 27, 2020·5 cites·17 claims
- 0489US12366811B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2024·Granted Jul 22, 2025·0 cites·20 claims
- 0586US11415900B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2020·Granted Aug 16, 2022·1 cites·20 claims
- 0686US11119415B2Method of determining a characteristic of a structure, and metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Sep 14, 2021·3 cites·17 claims
- 0780US11009343B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2019·Granted May 18, 2021·2 cites·15 claims
- 0878US2025014164A1Metrology method and method for training a data structure for use in metrologyASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0977US12007700B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 1076US11709436B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2021·Granted Jul 25, 2023·0 cites·20 claims
- 1175US11650047B2Metrology apparatus and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 1267US12399434B2Method of determining a characteristic of a structure, and metrology apparatusASML NETHERLANDS BV·Filed 2021·Granted Aug 26, 2025·0 cites·15 claims
- 1364US2022309645A1Metrology Method and Method for Training a Data Structure for Use in MetrologyASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 1460US12405535B2Method for filtering an image and associated metrology apparatusASML HOLDING NV·Filed 2020·Granted Sep 2, 2025·0 cites·15 claims
- 1558US2024345489A1Metrology method and metrology deviceASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1651US2023044632A1Dark field digital holographic microscope and associated metrology methodASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 1748US2023064193A1Metrology method and device for measuring a periodic structure on a substrateASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1847US2024160151A1Digital holographic microscope and associated metrology methodASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →