Inventor · disambiguated record
Waiman Ng
Also filed as: NG WAIMAN
3 granted patents·135 citations·filing 1998–2004
75Inventor score
Technology areasH01J
Top patents by PatentIndex Score
3 records- 0193US6066849AScanning electron beam microscopeKLA TENCOR·Filed 1998·Granted May 23, 2000·103 cites·27 claims
- 0268US7015468B1Methods of stabilizing measurement of ArF resist in CD-SEMKLA TENCOR TECH CORP·Filed 2004·Granted Mar 21, 2006·10 cites·20 claims
- 0368US6570154B1Scanning electron beam microscopeKLA TENCOR TECH CORP·Filed 1999·Granted May 27, 2003·22 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →