Inventor · disambiguated record
Wenjian Cai
Also filed as: CAI WENJIAN
12 granted patents·1 pending application·36 citations·filing 2013–2024
88Inventor score
Top patents by PatentIndex Score
13 records- 0189US9395340B2Interleaved acousto-optical device scanning for suppression of optical crosstalkKLA TENCOR CORP·Filed 2013·Granted Jul 19, 2016·8 cites·26 claims
- 0287US9546962B2Multi-spot scanning collection opticsKLA TENCOR CORP·Filed 2015·Granted Jan 17, 2017·4 cites·20 claims
- 0387US8995746B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2013·Granted Mar 31, 2015·7 cites·21 claims
- 0486US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 0584US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 0682US11061116B2Lidar system with image size compensation mechanismNURO INC·Filed 2018·Granted Jul 13, 2021·4 cites·13 claims
- 0779US11294035B2LiDAR system with cylindrical lensesNURO INC·Filed 2018·Granted Apr 5, 2022·3 cites·20 claims
- 0874US11835652B2LiDAR system with cylindrical lensesNURO INC·Filed 2022·Granted Dec 5, 2023·0 cites·18 claims
- 0972US9208553B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2015·Granted Dec 8, 2015·1 cites·23 claims
- 1070US2025271775A1Off-axis through the lens mutually coherent dark field imaging system with incoherent light for overlay metrologyKLA CORP·Filed 2024·Application pending·0 cites
- 1166US9970883B2Multi-spot scanning collection opticsKLA TENCOR CORP·Filed 2017·Granted May 15, 2018·1 cites·22 claims
- 1259US10060884B2Interleaved acousto-optical device scanning for suppression of optical crosstalkKLA TENCOR CORP·Filed 2016·Granted Aug 28, 2018·0 cites·26 claims
- 1342US9864173B2Systems and methods for run-time alignment of a spot scanning wafer inspection systemKLA TENCOR CORP·Filed 2016·Granted Jan 9, 2018·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →